Authors:
PETERSE WJAM
SCHOLTE PMLO
STEINFORT AJ
TUINSTRA F
Citation: Wjam. Peterse et al., NEW APPLICATION OF CLASSICAL X-RAY-DIFFRACTION METHODS FOR EPITAXIAL FILM CHARACTERIZATION, Thin solid films, 289(1-2), 1996, pp. 49-53
Authors:
STAUBLEPUMPIN B
MATIJASEVIC VC
ILGE B
MOOIJ JE
PETERSE WJAM
SCHOLTE PMLO
TUINSTRA F
VENVIK HJ
WAI DS
TRAEHOLT C
WEN JG
ZANDBERGEN HW
Citation: B. Staublepumpin et al., GROWTH MECHANISMS OF COEVAPORATED SMBA2CU3OY, THIN-FILMS, Physical review. B, Condensed matter, 52(10), 1995, pp. 7604-7618
Authors:
STAUBLEPUMPIN B
MATIJASEVIC VC
WEN JG
APPELBOOM HM
ILGE B
VENVIK J
MOOIJ JE
PETERSE WJAM
SCHOLTE PMLO
TUINSTRA F
ZANDBERGEN HW
Citation: B. Staublepumpin et al., NUCLEATION AND GROWTH OF C-PARALLEL GRAINS IN COEVAPORATED SMBA2CU3OYFILMS, Physica. C, Superconductivity, 235, 1994, pp. 679-680