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Results:
1-11
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Results: 11
Authors:
WESNER DA
WEICHENHAIN R
PFLEGING W
HORN H
KREUTZ EW
Citation: Da. Wesner et al., CHEMICAL-ANALYSIS OF THE INTERFACE BETWEEN AL THIN-FILMS AND POLYMER SURFACES PRETREATED WITH KRF-EXCIMER LASER-RADIATION, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 248-250
Authors:
PFLEGING W
VORCKEL A
DUDDEK H
WESNER DA
KREUTZ EW
Citation: W. Pfleging et al., EXCIMER-LASER PATTERNING OF COPPER IN LDE (LASER DRY-ETCHING), Applied surface science, 110, 1997, pp. 194-200
Authors:
WEICHENHAIN R
WESNER DA
PFLEGING W
HORN H
KREUTZ EW
Citation: R. Weichenhain et al., KRF-EXCIMER LASER PRETREATMENT AND METALLIZATION OF POLYMERS, Applied surface science, 110, 1997, pp. 264-269
Authors:
WESNER DA
HORN H
WEICHENHAIN R
PFLEGING W
KREUTZ EW
Citation: Da. Wesner et al., PRETREATMENT BY LASER-RADIATION AND ITS EFFECT ON ADHESION IN THE METALLIZATION OF POLY(BUTYLENE TEREPHTHALATE), Journal of adhesion science and technology, 11(9), 1997, pp. 1229-1242
Authors:
KLOTZBUCHER T
PFLEGING W
WESNER DA
MERGENS M
KREUTZ EW
Citation: T. Klotzbucher et al., STRUCTURAL AND CHEMICAL CHARACTERIZATION OF BN THIN-FILMS DEPOSITED ONTO SI(100) AND GRAPHITE SUBSTRATES BY PULSED-LASER DEPOSITION, DIAMOND AND RELATED MATERIALS, 5(3-5), 1996, pp. 525-529
Authors:
PFLEGING W
WESNER DA
KREUTZ EW
Citation: W. Pfleging et al., CCL4-ASSISTED CF4 ETCHING OF SILICON IN A MICROWAVE-ASSISTED LDE (LASER DRY ETCHING)-PROCESS, Applied surface science, 96-8, 1996, pp. 496-500
Authors:
WESNER DA
PFLEGING W
KLOTZBUCHER T
KREUTZ EW
Citation: Da. Wesner et al., SURFACE-ANALYSIS OF FILMS AND FILM SYSTEMS PRODUCED BY PULSED-LASER DEPOSITION, Fresenius' journal of analytical chemistry, 353(5-8), 1995, pp. 729-733
Authors:
PFLEGING W
KLOTZBUCHER T
WESNER DA
KREUTZ EW
Citation: W. Pfleging et al., STRUCTURE AND CHEMICAL-COMPOSITION OF BN THIN-FILMS GROWN BY PULSED-LASER DEPOSITION, DIAMOND AND RELATED MATERIALS, 4(4), 1995, pp. 370-374
Authors:
KLOTZBUCHER T
PFLEGING W
MERTIN M
WESNER DA
KREUTZ EW
Citation: T. Klotzbucher et al., STRUCTURE AND CHEMICAL-COMPOSITION OF BN THIN-FILMS GROWN BY PULSED-LASER DEPOSITION (PLD), Applied surface science, 86(1-4), 1995, pp. 165-169
Authors:
KREUTZ EW
FRERICHS H
MERTIN M
WESNER DA
PFLEGING W
Citation: Ew. Kreutz et al., TAILORING OF SURFACE-PROPERTIES BY REMOVAL AND DEPOSITION WITH LASER-RADIATION, Applied surface science, 86(1-4), 1995, pp. 266-277
Authors:
KREUTZ EW
ALUNOVIC M
VOSS A
PFLEGING W
SUNG H
WESNER DA
Citation: Ew. Kreutz et al., PROPERTIES AND APPLICATIONS OF SINGLE-COMPONENT (AL2O3, ZRO2, BN) ANDMULTICOMPONENT FILMS (ZRO2, TI) FABRICATED BY PULSED-LASER DEPOSITION, Surface & coatings technology, 68, 1994, pp. 238-243
Risultati:
1-11
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