Citation: R. Hofmann et Hj. Pfleiderer, ELECTROOPTIC SAMPLING SYSTEM FOR THE TESTING OF HIGH-SPEED INTEGRATED-CIRCUITS USING A FREE-RUNNING SOLID-STATE LASER, Journal of lightwave technology, 14(8), 1996, pp. 1788-1793
Citation: R. Hofmann et Hj. Pfleiderer, SIMULATIONS OF THE POTENTIAL DISTRIBUTION AND THE RESULTING MEASUREMENT SIGNAL IN LONGITUDINAL EXTERNAL ELECTROOPTIC PROBE TIPS, Microelectronic engineering, 31(1-4), 1996, pp. 377-384
Citation: G. Nebel et al., LARGE BANDWIDTH BICMOS OPERATIONAL-AMPLIFIERS FOR SC VIDEO APPLICATIONS (VOL 31, PG 828, 1996), IEEE journal of solid-state circuits, 31(9), 1996, pp. 1365-1365
Citation: G. Nebel et al., LARGE BANDWIDTH BICMOS OPERATIONAL-AMPLIFIERS FOR SC VIDEO APPLICATIONS, IEEE journal of solid-state circuits, 31(6), 1996, pp. 828-834
Citation: M. Rau et Hj. Pfleiderer, AN ECL TO CMOS LEVEL CONVERTER WITH COMPLEMENTARY BIPOLAR OUTPUT STAGE, IEEE journal of solid-state circuits, 30(7), 1995, pp. 781-787
Citation: G. Baur et al., HIGH-VOLTAGE RESOLUTION WITH A LASER-DIODE BASED ELECTROOPTIC MEASUREMENT SYSTEM, Microelectronic engineering, 24(1-4), 1994, pp. 393-400
Authors:
BAUR G
SOLKNER G
GLOCKLE WG
PFLEIDERER HJ
Citation: G. Baur et al., ELIMINATION OF PHASE NOISE OF PULSED-LASER DIODES IN ELECTROOPTIC SAMPLING SYSTEMS, IEEE journal of quantum electronics, 29(4), 1993, pp. 1022-1026