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Results: 1-25/27
Authors:
PICKERING C
Citation: C. Pickering, COMPLEMENTARY IN-SITU AND POSTDEPOSITION DIAGNOSTICS OF THIN-FILM SEMICONDUCTOR STRUCTURES, Thin solid films, 313, 1998, pp. 406-415
Authors:
PICKERING C
RUSSELL J
NAYAR V
IMSCHWEILER J
WILLE H
HARRINGTON S
WIGGINS C
STEHLE JL
PIEL JP
BRUCHEZ J
Citation: C. Pickering et al., EVALUATION OF AUTOMATED SPECTROSCOPIC ELLIPSOMETRY FOR IN-LINE PROCESS-CONTROL - ESPRIT SEMICONDUCTOR EQUIPMENT ASSESSMENT (SEA) PROJECT IMPROVE, Thin solid films, 313, 1998, pp. 446-453
Authors:
CARLINE RT
RUSSELL J
HOSEA TJC
THOMAS PJS
PICKERING C
Citation: Rt. Carline et al., REAL-TIME PHOTO-SPECTROSCOPIC ELLIPSOMETRY MEASUREMENT OF ELECTRIC-FIELD AND COMPOSITION IN SEMICONDUCTORS, Thin solid films, 313, 1998, pp. 579-582
Authors:
PICKERING C
Citation: C. Pickering, SHELF-LIFE, Forbes, 1998, pp. 24-24
Authors:
PICKERING C
Citation: C. Pickering, SHELF-LIFE - WHAT TECHNOLOGY IS HOT - WHATS NOT, Forbes, 1998, pp. 26-26
Authors:
PICKERING C
Citation: C. Pickering, SHELF-LIFE, Forbes, 1998, pp. 30-30
Authors:
PICKERING C
Citation: C. Pickering, INSIDE PLAYS - COMPANIES TO RIDE IN A GALLOPING MARKET, Forbes, 1998, pp. 64-64
Authors:
PICKERING C
Citation: C. Pickering, A TALE OF 2 STARTUPS, Forbes, 1998, pp. 85-85
Authors:
HOPE DAO
PICKERING C
CARLINE RT
LEONG WY
ROBBINS DJ
Citation: Dao. Hope et al., REAL-TIME CONTROL OF LAYER THICKNESS IN LPCVD SI SI.GE-88.(12) HBT STRUCTURES/, Thin solid films, 294(1-2), 1997, pp. 18-21
Authors:
FISHWICK D
FLETCHER AM
ANTHONY C
PICKERING C
NIVEN RM
FARAGHER EB
Citation: D. Fishwick et al., LUNG-FUNCTION IN LANCASHIRE COTTON AND MAN-MADE FIBER SPINNING MILL OPERATIVES, Occupational and environmental medicine, 53(1), 1996, pp. 46-50
Authors:
NEJIM A
CRISTIANO F
HEMMENT PLF
HOPE DAO
GLASPER JL
PICKERING C
LEONG WY
ROBBINS DJ
Citation: A. Nejim et al., A STUDY OF BASE CONTACT FORMATION IN EPITAXIAL SI SI0.88GE0.12 HBT STRUCTURES/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 112(1-4), 1996, pp. 305-310
Authors:
ROBBINS DJ
STANAWAY MB
LEONG WY
GLASPER JL
PICKERING C
Citation: Dj. Robbins et al., SI1-XGEX SI QUANTUM-WELL INFRARED PHOTODETECTORS/, Journal of materials science. Materials in electronics, 6(5), 1995, pp. 363-367
Authors:
PICKERING C
HOPE DAO
CARLINE RT
ROBBINS DJ
Citation: C. Pickering et al., REAL-TIME SPECTROSCOPIC ELLIPSOMETRY MONITORING OF SI1-XGEX SI EPITAXIAL-GROWTH/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 740-744
Authors:
CARLINE RT
PICKERING C
HOSEA TJC
HALL DJ
Citation: Rt. Carline et al., PHOTOREFLECTANCE SPECTROSCOPY OF PSEUDOMORPHIC SI1-XGEX(100) STRUCTURES (X-LESS-THAN-0.26), Materials science and technology, 11(4), 1995, pp. 416-420
Authors:
KROLICK C
PICKERING C
HOIBERG R
SASSETTI R
Citation: C. Krolick et al., EVALUATION IMPLEMENTATION OF SOLID-PHASE TECHNOLOGY INTO MICROPLATE BATCH TESTING, Transfusion, 35(10), 1995, pp. 28-28
Authors:
PICKERING C
CARLINE RT
HOPE DAO
ROBBINS DJ
Citation: C. Pickering et al., REAL-TIME MONITORING OF SI1-XGEX HETEROEPITAXIAL GROWTH USING LASER-LIGHT SCATTERING AND SPECTROSCOPIC ELLIPSOMETRY, Physica status solidi. a, Applied research, 152(1), 1995, pp. 95-102
Authors:
PICKERING C
Citation: C. Pickering, NONDESTRUCTIVE CHARACTERIZATION OF SEMICONDUCTOR MULTILAYERS, JOM, 46(9), 1994, pp. 60-64
Authors:
CARLINE RT
PICKERING C
HOSEA TJC
ROBBINS DJ
Citation: Rt. Carline et al., PHOTOREFLECTANCE OF STRAINED SI1-XGEX EPILAYERS ESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-0.26) AND COMPARISON WITH SPECTROSCOPIC ELLIPSOMETRY, Applied surface science, 81(4), 1994, pp. 475-483
Authors:
MANI KS
SIDHARTA P
PICKERING C
Citation: Ks. Mani et al., EDUCATIONAL-ASPECTS IN THE EDUCATION OF HEALTH-WORKERS, PATIENTS, ANDTHE PUBLIC .11. VIEWPOINTS FROM SOUTH-INDIA, INDONESIA AND KENYA, Tropical and geographical medicine, 46(3), 1994, pp. 190000034-190000036
Authors:
CANHAM LT
CULLIS AG
PICKERING C
DOSSER OD
COX TI
LYNCH TP
Citation: Lt. Canham et al., LUMINESCENT ANODIZED SILICON AEROCRYSTAL NETWORKS PREPARED BY SUPERCRITICAL DRYING, Nature, 368(6467), 1994, pp. 133-135
Authors:
PICKERING C
CARLINE RT
Citation: C. Pickering et Rt. Carline, DIELECTRIC FUNCTION SPECTRA OF STAINED AND RELAXED SI(1-X)GE(X) ALLOYS (X=0-0.25), Journal of applied physics, 75(9), 1994, pp. 4642-4647
Authors:
CARLINE RT
PICKERING C
ROBBINS DJ
LEONG WY
PITT AD
CULLIS AG
Citation: Rt. Carline et al., SPECTROSCOPIC ELLIPSOMETRY OF SI1-XGEX EPILAYERS OF ARBITRARY COMPOSITION ESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-0.255, Applied physics letters, 64(9), 1994, pp. 1114-1116
Authors:
CARLINE RT
PICKERING C
CALCOTT P
ROBBINS DJ
LEONG WY
PITT AD
BARNETT SJ
CULLIS AG
Citation: Rt. Carline et al., SPECTROSCOPIC ELLIPSOMETRY OF SE1-XGEX MULTIQUANTUM WELLS, Superlattices and microstructures, 14(2-3), 1993, pp. 157-165
Authors:
NAYAR V
PICKERING C
PIDDUCK AJ
CARLINE RT
LEONG WY
ROBBINS DJ
Citation: V. Nayar et al., THE SURFACE-ROUGHNESS AND OPTICAL-PROPERTIES OF HIGH-QUALITY SI EPITAXIAL LAYERS, Thin solid films, 233(1-2), 1993, pp. 40-45
Authors:
PICKERING C
CARLINE RT
ROBBINS DJ
LEONG WY
GRAY DE
GREEF R
Citation: C. Pickering et al., IN-SITU DUAL-WAVELENGTH AND EX-SITU SPECTROSCOPIC ELLIPSOMETRY STUDIES OF STRAINED SIGE EPITAXIAL LAYERS AND MULTIQUANTUM-WELL STRUCTURES, Thin solid films, 233(1-2), 1993, pp. 126-130