Authors:
BARTH KL
FUKAREK W
MAUCHER HP
PLASS MF
LUNK A
Citation: Kl. Barth et al., IN-SITU CHARACTERIZATION OF CUBIC BORON-NITRIDE FILM GROWTH IN THE IRSPECTRAL REGION, Thin solid films, 313, 1998, pp. 697-703
Citation: Mf. Plass et al., GROWTH AND CHARACTERIZATION OF BORON-NITRIDE FILMS - LAYER SEQUENCE AND PHASE IDENTIFICATION, DIAMOND AND RELATED MATERIALS, 6(5-7), 1997, pp. 594-598
Citation: Mf. Plass et al., LAYERED STRUCTURE DIAGNOSTIC AND OPTICAL MODELING OF C-BN FILMS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 127, 1997, pp. 857-860
Authors:
PLASS MF
FUKAREK W
KOLITSCH A
MADER M
MOLLER W
Citation: Mf. Plass et al., EVIDENCE FOR LAYERED STRUCTURE OF BORON-NITRIDE FILMS DETECTED BY RUTHERFORD BACKSCATTERING, Physica status solidi. a, Applied research, 155(2), 1996, pp. 1-4
Citation: Mf. Plass et al., PHASE IDENTIFICATION OF BORON-NITRIDE THIN-FILMS BY POLARIZED INFRARED REFLECTION SPECTROSCOPY, Applied physics letters, 69(1), 1996, pp. 46-48
Citation: Mf. Plass et al., ELECTRONIC AND STRUCTURAL-PROPERTIES OF THE A-SI-H A-SINXH INTERFACE/, Journal of non-crystalline solids, 166, 1993, pp. 829-832