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Results: 1-6 |
Results: 6

Authors: SINGH R NIMMAGADDA SV PARIHAR V CHEN YN POOLE KF
Citation: R. Singh et al., ROLE OF RAPID PHOTOTHERMAL PROCESSING IN-PROCESS INTEGRATION, I.E.E.E. transactions on electron devices, 45(3), 1998, pp. 643-654

Authors: LIU Y POOLE KF SINGH R HARRISS J DIEFENDORF RJ
Citation: Y. Liu et al., CHARACTERIZATION OF AL-1 WT-PERCENT Y THIN-FILMS FOR VLSI INTERCONNECTS, Thin solid films, 308, 1997, pp. 460-464

Authors: MOOSA MS POOLE KF GRAMS ML
Citation: Ms. Moosa et al., EFSIM - AN INTEGRATED-CIRCUIT EARLY FAILURE SIMULATOR, Quality and reliability engineering international, 12(4), 1996, pp. 229-234

Authors: MENON SS POOLE KF
Citation: Ss. Menon et Kf. Poole, EARLY-LIFE RELIABILITY PREDICTION METHODOLOGY FOR INTEGRATED-CIRCUITS, Microelectronics and reliability, 35(8), 1995, pp. 1147-1155

Authors: MOOSA MS POOLE KF
Citation: Ms. Moosa et Kf. Poole, SIMULATING IC RELIABILITY WITH EMPHASIS ON PROCESS-FLAW RELATED EARLYFAILURES, IEEE transactions on reliability, 44(4), 1995, pp. 556-561

Authors: WAIT MA MAVOORI J SINGH R HARRISS JE POOLE KF KOLIS JW THAKUR RPS OGALE AA
Citation: Ma. Wait et al., EFFECTS OF DUAL SPECTRAL SOURCES ON THE CURING OF POLYIMIDE FILMS BY RAPID ISOTHERMAL PROCESSING, Applied physics letters, 64(24), 1994, pp. 3234-3236
Risultati: 1-6 |