Authors: BALYSHEV KV PUTILIN ES STAROVOITOV SF

Citation: Kv. Balyshev et al., STUDY OF THE REPRODUCIBILITY OF THE OUTPUT PARAMETERS OF MULTILAYER DIELECTRIC SYSTEMS DURING FABRICATION, Journal of optical technology, 65(3), 1998, pp. 207-210

Authors: KIM CS PUTILIN ES

Citation: Cs. Kim et Es. Putilin, FORMING THE THICKNESS OF LAYERS BY VACUUM EVAPORATION, Journal of optical technology, 65(10), 1998, pp. 843-846

Authors: KIM CS PUTILIN ES

Citation: Cs. Kim et Es. Putilin, PHOTOMETRIC MONITORING OF THE THICKNESS OF LAYERS WITH A VARIABLE PROFILE, Journal of optical technology, 65(10), 1998, pp. 847-850

Authors: KIM CS PUTILIN ES

Citation: Cs. Kim et Es. Putilin, MATHEMATICAL-MODELING OF THE DEPOSITION OF OPTICAL THIN-FILMS, Journal of optical technology, 64(8), 1997, pp. 750-754

Authors: ALADOV AV BEZZUBIK VV BELASHENKOV NR GUBANOVA LA KARASEV VB PARAKHUDA SE PUTILIN ES KHLOPONIN LV KHRAMOV VY

Citation: Av. Aladov et al., USING MIRRORS WITH QUASI-TRAPEZOIDAL REFLECTANCE DISTRIBUTION PROFILES IN THE CAVITIES OF HIGH-RADIANCE SOLID-STATE LASERS, Journal of optical technology, 62(8), 1995, pp. 505-508

Authors: PUTILIN ES GUBANOVA LA

Citation: Es. Putilin et La. Gubanova, INTERFERENCE FILTERS THAT FORM THE PHASE AND AMPLITUDE CHARACTERISTICS OF REFLECTED AND TRANSMITTED RADIATION, Journal of optical technology, 62(8), 1995, pp. 557-562