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Results: 1-11 |
Results: 11
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy
Authors: Woo, J Hong, S Setter, N Shin, H Jeon, JU Pak, YE No, K
Citation: J. Woo et al., Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy, J VAC SCI B, 19(3), 2001, pp. 818-824
Evaluation of microfracture toughness and microcracking with notch tip radius of Si film structure for microactuator in hard disk drives
Authors: Lee, SH Kim, JS Evans, JW Son, D Pak, YE Jeon, JU Kwon, D
Citation: Sh. Lee et al., Evaluation of microfracture toughness and microcracking with notch tip radius of Si film structure for microactuator in hard disk drives, MICROSYST T, 7(3), 2001, pp. 91-98
Heat transfer enhancement using flow-induced vibration of a microfin array
Authors: Go, JS Kim, SJ Lim, G Yun, H Lee, J Song, I Pak, YE
Citation: Js. Go et al., Heat transfer enhancement using flow-induced vibration of a microfin array, SENS ACTU-A, 90(3), 2001, pp. 232-239
Formation and characterization of crystalline iron oxide films on self-assembled organic monolayers and their in situ patterning
Authors: Shin, H Jeon, JU Pak, YE Im, H Kim, ES
Citation: H. Shin et al., Formation and characterization of crystalline iron oxide films on self-assembled organic monolayers and their in situ patterning, J MATER RES, 16(2), 2001, pp. 564-569
Principle of ferroelectric domain imaging using atomic force microscope
Authors: Hong, S Woo, J Shin, H Jeon, JU Pak, YE Colla, EL Setter, N Kim, E No, K
Citation: S. Hong et al., Principle of ferroelectric domain imaging using atomic force microscope, J APPL PHYS, 89(2), 2001, pp. 1377-1386
Effect of metal-insulator-semiconductor structure derived space charge field on the tip vibration signal in electrostatic force microscopy
Authors: Hong, SB Woo, JW Shin, HJ Kim, E Kim, KH Jeon, JU Pak, YE No, K
Citation: Sb. Hong et al., Effect of metal-insulator-semiconductor structure derived space charge field on the tip vibration signal in electrostatic force microscopy, J VAC SCI B, 18(6), 2000, pp. 2688-2691
Formation of ferroelectric nano-domains using scanning force microscopy for the future application of memory devices
Authors: Shin, H Woo, J Hong, S Jeon, JU Pak, YE No, K
Citation: H. Shin et al., Formation of ferroelectric nano-domains using scanning force microscopy for the future application of memory devices, INTEGR FERR, 31(1-4), 2000, pp. 163-171
Five-port equivalent electric circuit of piezoelectric bimorph beam
Authors: Cho, YS Pak, YE Han, CS Ha, SK
Citation: Ys. Cho et al., Five-port equivalent electric circuit of piezoelectric bimorph beam, SENS ACTU-A, 84(1-2), 2000, pp. 140-148
An application of polarized domains in ferroelectric thin films using scanning probe microscope
Authors: Shin, H Lee, KM Moon, WK Jeon, JU Lim, G Pak, YE Park, JH Yoon, KH
Citation: H. Shin et al., An application of polarized domains in ferroelectric thin films using scanning probe microscope, IEEE ULTRAS, 47(4), 2000, pp. 801-807
Interaction between a semi-infinite crack and a screw dislocation in a piezoelectric material
Authors: Lee, KY Lee, WG Pak, YE
Citation: Ky. Lee et al., Interaction between a semi-infinite crack and a screw dislocation in a piezoelectric material, J APPL MECH, 67(1), 2000, pp. 165-170
Detection mechanism of spontaneous polarization in ferroelectric thin films using electrostatic force microscopy
Authors: Lee, K Shin, H Moon, WK Jeon, JU Pak, YE
Citation: K. Lee et al., Detection mechanism of spontaneous polarization in ferroelectric thin films using electrostatic force microscopy, JPN J A P 2, 38(3A), 1999, pp. L264-L266
Risultati: 1-11 |