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Results: 26-34/34
Authors:
van Agterveld, DTL
Palasantzas, G
De Hosson, JTM
Citation: Dtl. Van Agterveld et al., Magnesium surface segregation and oxidation in Al-Mg alloys studied with local probe scanning Auger-scanning electron microscopy, APPL SURF S, 152(3-4), 1999, pp. 250-258
Authors:
Ilge, B
Palasantzas, G
Geerligs, LJ
Citation: B. Ilge et al., Submonolayer growth of Co on H-passivated Si(100) surfaces and nanoscale metallization with Co on patterned H-Si(100), APPL SURF S, 145, 1999, pp. 543-547
Authors:
Palasantzas, G
Ilge, B
Rogge, S
Geerlings, LJ
Citation: G. Palasantzas et al., Technology for nanoelectronic devices based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface, MICROEL ENG, 46(1-4), 1999, pp. 133-136
Authors:
Zhao, YP
Palasantzas, G
Wang, GC
De Hosson, JTM
Citation: Yp. Zhao et al., Surface/interface-roughness-induced demagnetizing effect in thin magnetic films, PHYS REV B, 60(2), 1999, pp. 1216-1226
Authors:
Zhao, YP
Wang, GC
Lu, TM
Palasantzas, G
De Hosson, JTM
Citation: Yp. Zhao et al., Surface-roughness effect on capacitance and leakage current of an insulating film, PHYS REV B, 60(12), 1999, pp. 9157-9164
Authors:
Palasantzas, G
Citation: G. Palasantzas, Enhancement of proximity effects due to random roughness at a superconductor/metal interface, SOL ST COMM, 112(2), 1999, pp. 97-100
Authors:
Palasantzas, G
Citation: G. Palasantzas, Static and dynamic aspects of the demagnetizing factor in magnetic thin films with random rough surfaces, J APPL PHYS, 86(4), 1999, pp. 2196-2199
Authors:
Palasantzas, G
Ilge, B
De Nijs, J
Geerligs, LJ
Citation: G. Palasantzas et al., Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces, J APPL PHYS, 85(3), 1999, pp. 1907-1910
Authors:
van Agterveld, DTL
Palasantzas, G
De Hosson, JTM
Citation: Dtl. Van Agterveld et al., Surface sensitivity effects with local probe scanning Auger-scanning electron microscopy, APPL PHYS L, 75(8), 1999, pp. 1080-1082