Citation: Jg. Park et al., Nature of surface and bulk defect induced by low dose oxygen implantation in separation by implanted oxygen wafers, JPN J A P 1, 40(4A), 2001, pp. 2178-2185
Citation: Hj. Kim et al., Physical and chemical characterization of reused oxide chemical mechanicalplanarization slurry, JPN J A P 1, 40(3A), 2001, pp. 1236-1239
Citation: Jg. Park et al., Particle removal and its mechanism on hydrophobic silicon wafer in highly diluted NH4OH solutions with an added surfactant, JPN J A P 1, 40(11), 2001, pp. 6182-6186
Citation: Jg. Park et al., Spectral analyses of the impact of nanotopography of silicon wafers on oxide chemical mechanical polishing, JPN J A P 2, 40(8B), 2001, pp. L857-L860
Citation: Kh. Kwak et Jg. Park, Shear-fatigue behavior of high-strength reinforced concrete beams under repeated loading, STRUC ENG M, 11(3), 2001, pp. 301-314
Citation: Jg. Park et al., Pressure-dependent resistivity studies and the origin of non-Fermi-liquid behaviour in UxY1-xPd3, J PHYS-COND, 13(5), 2001, pp. 1063-1069
Citation: Jk. Lee et al., Influence of sintering atmosphere on the fabrication of SiC ceramics with a powder mixture of sialon composition, J MATER RES, 16(6), 2001, pp. 1784-1788
Citation: Jg. Park et al., The operating characteristics of the compressor-driven metal hydride heat pump system, INT J HYD E, 26(7), 2001, pp. 701-706