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Citation: Dj. Kang et al., Nanometer scale masked ion damage barriers in YBa2Cu3O7-delta, IEEE APPL S, 11(1), 2001, pp. 780-783

Authors: Kahlmann, F Booij, WE Blamire, MG McBrien, PF Peng, NH Jeynes, C Romans, EJ Pegrum, CM Tarte, EJ

Citation: F. Kahlmann et al., Performance of high-T-c dc SQUID magnetometers with resistively shunted inductances compared to "unshunted" devices, IEEE APPL S, 11(1), 2001, pp. 916-919

Authors: Peng, NH Jeynes, C Webb, RP Chakarov, IR Blamire, MG

Citation: Nh. Peng et al., Monte Carlo simulations of masked ion beam irradiation damage profiles in YBa2Cu3O7-delta thin films, NUCL INST B, 178, 2001, pp. 242-246

Authors: Peng, NH Chakarov, I Jeynes, C Webb, R Booij, W Blamire, M Kelly, M

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Authors: Kahlmann, F Booij, WE Blamire, MG McBrien, PF Tarte, EJ Peng, NH Jeynes, C Romans, EJ Pegrum, CM

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Authors: Booij, WE Elwell, CA Tarte, EJ McBrien, PF Kahlmann, F Moore, DF Blamire, MG Peng, NH Jeynes, C

Citation: We. Booij et al., Electrical properties of electron and ion beam irradiated YBa2Cu3O7-delta, IEEE APPL S, 9(2), 1999, pp. 2886-2889