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Results: 1-12 |
Results: 12
Scaling relations and universality in electrical failure processes of thinfilms: is it possible to predict failure times?
Authors: Pennetta, C Reggiani, L Trefan, G
Citation: C. Pennetta et al., Scaling relations and universality in electrical failure processes of thinfilms: is it possible to predict failure times?, COMP MAT SC, 22(1-2), 2001, pp. 7-12
Investigation of the role of compositional effects on electromigration damage of metallic interconnects
Authors: Pennetta, C Reggiani, L Treffan, G Fantini, F Scorzoni, A De Munari, I
Citation: C. Pennetta et al., Investigation of the role of compositional effects on electromigration damage of metallic interconnects, COMP MAT SC, 22(1-2), 2001, pp. 13-18
Electrical instability of thin films driven by Joule heating
Authors: Pennetta, C Reggiani, L
Citation: C. Pennetta et L. Reggiani, Electrical instability of thin films driven by Joule heating, COMP MAT SC, 20(3-4), 2001, pp. 451-455
A Monte Carlo percolative approach to reliability analysis of semiconductor structures
Authors: Pennetta, C Reggiani, L Trefan, G
Citation: C. Pennetta et al., A Monte Carlo percolative approach to reliability analysis of semiconductor structures, MATH COMP S, 55(1-3), 2001, pp. 231-238
A percolative simulation of electromigration phenomena
Authors: Pennetta, C Reggiani, L Trefan, G Fantini, F DeMunari, I Scorzoni, A
Citation: C. Pennetta et al., A percolative simulation of electromigration phenomena, MICROEL ENG, 55(1-4), 2001, pp. 349-353
A percolative approach to electromigration in metallic lines
Authors: Pennetta, C Reggiani, L Trefan, G Fantini, F Scorzoni, A De Munari, I
Citation: C. Pennetta et al., A percolative approach to electromigration in metallic lines, J PHYS D, 34(9), 2001, pp. 1421-1429
Scaling law of resistance fluctuations in stationary random resistor networks
Authors: Pennetta, C Trefan, G Reggiani, L
Citation: C. Pennetta et al., Scaling law of resistance fluctuations in stationary random resistor networks, PHYS REV L, 85(24), 2000, pp. 5238-5241
Scaling and universality in electrical failure of thin films
Authors: Pennetta, C Reggiani, L Trefan, G
Citation: C. Pennetta et al., Scaling and universality in electrical failure of thin films, PHYS REV L, 84(21), 2000, pp. 5006-5009
A percolative approach to reliability of thin films
Authors: Pennetta, C Reggiani, L Trefan, G
Citation: C. Pennetta et al., A percolative approach to reliability of thin films, IEEE DEVICE, 47(10), 2000, pp. 1986-1991
Excess thermal-noise in the electrical breakdown of random resistor networks
Authors: Pennetta, C Kiss, LB Gingl, Z Reggiani, L
Citation: C. Pennetta et al., Excess thermal-noise in the electrical breakdown of random resistor networks, EUR PHY J B, 12(1), 1999, pp. 61-65
Thermal effects on the electrical degradation of thin film resistors
Authors: Pennetta, C Reggiani, L Kiss, LB
Citation: C. Pennetta et al., Thermal effects on the electrical degradation of thin film resistors, PHYSICA A, 266(1-4), 1999, pp. 214-217
A stochastic approach to failure analysis in electromigration phenomena
Authors: Pennetta, C Reggiani, L Trefan, G Fantini, F DeMunari, I Scorzoni, A
Citation: C. Pennetta et al., A stochastic approach to failure analysis in electromigration phenomena, MICROEL REL, 39(6-7), 1999, pp. 857-862
Risultati: 1-12 |