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Results: 1-10 |
Results: 10
Single-image signal-to-noise ratio estimation
Authors: Thong, JTL Sim, KS Phang, JCH
Citation: Jtl. Thong et al., Single-image signal-to-noise ratio estimation, SCANNING, 23(5), 2001, pp. 328-336
Single contact optical beam induced currents
Authors: Chin, JM Phang, JCH Chan, DSH Palaniappan, M Gilfeather, G Soh, CE
Citation: Jm. Chin et al., Single contact optical beam induced currents, MICROEL REL, 41(8), 2001, pp. 1237-1242
Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device
Authors: Heiderhoff, R Palaniappan, M Phang, JCH Balk, LJ
Citation: R. Heiderhoff et al., Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device, MICROEL REL, 40(8-10), 2000, pp. 1383-1388
Comparison between standard and near-field cathodoluminescence
Authors: Heiderhoff, R Sergeev, OV Liu, YY Phang, JCH Balk, LJ
Citation: R. Heiderhoff et al., Comparison between standard and near-field cathodoluminescence, J CRYST GR, 210(1-3), 2000, pp. 303-306
Can physical analysis aid in device characterization?
Authors: Chan, DSH Chim, WK Phang, JCH Liu, YY Ng, TH Xiao, H
Citation: Dsh. Chan et al., Can physical analysis aid in device characterization?, J CRYST GR, 210(1-3), 2000, pp. 323-330
Investigation of light emitting diodes using nuclear microprobes
Authors: Yang, CY Bettiol, A Jamieson, D Hua, X Phang, JCH Chan, DSH Watt, F Osipowicz, T
Citation: Cy. Yang et al., Investigation of light emitting diodes using nuclear microprobes, NUCL INST B, 158(1-4), 1999, pp. 481-486
Front- and backside investigations of thermal and electronic properties ofsemiconducting devices
Authors: Fiege, GBM Schade, W Palaniappan, M Ng, V Phang, JCH Balk, LJ
Citation: Gbm. Fiege et al., Front- and backside investigations of thermal and electronic properties ofsemiconducting devices, MICROEL REL, 39(6-7), 1999, pp. 937-940
The properties of 2.7 eV cathodoluminescence from SiO2 film on Si substrate (vol 14, pg 1563, 1999)
Authors: Liu, X Phang, JCH Chan, DSH Chim, WK
Citation: X. Liu et al., The properties of 2.7 eV cathodoluminescence from SiO2 film on Si substrate (vol 14, pg 1563, 1999), J PHYS D, 32(21), 1999, pp. 2832-2832
The properties of 2.7 eV cathodoluminescence from SiO2 film on Si substrate
Authors: Liu, X Phang, JCH Chan, DSH Chim, WK
Citation: X. Liu et al., The properties of 2.7 eV cathodoluminescence from SiO2 film on Si substrate, J PHYS D, 32(14), 1999, pp. 1563-1569
Evaluation of electrical stress effects on SiO2-Si structures using scanning electron microscope cathodoluminescence
Authors: Liu, X Chan, DSH Chim, WK Phang, JCH
Citation: X. Liu et al., Evaluation of electrical stress effects on SiO2-Si structures using scanning electron microscope cathodoluminescence, APPL PHYS L, 73(24), 1998, pp. 3548-3549
Risultati: 1-10 |