Authors:
De Nicola, S
Ferraro, P
Finizio, A
Pierattini, G
Citation: S. De Nicola et al., Correct-image reconstruction in the presence of severe anamorphism by means of digital holography, OPTICS LETT, 26(13), 2001, pp. 974-976
Authors:
De Nicola, S
Ferraro, P
Finizio, A
Pierattini, G
Citation: S. De Nicola et al., Two-beam interferometer for measuring aberrations of optical components with axial symmetry, APPL OPTICS, 40(10), 2001, pp. 1631-1636
Authors:
De Nicola, S
Ferraro, P
Finizio, A
Pierattini, G
Pelli, S
Citation: S. De Nicola et al., Interferometric measurement of the refractive index and the thermo-optic coefficient of semiconductor-doped glasses, J OPT A-P A, 1(6), 1999, pp. 702-705
Authors:
de Angelis, M
De Nicola, S
Ferraro, P
Finizio, A
Pierattini, G
Hessler, T
Citation: M. De Angelis et al., An interferometric method for measuring short focal length refractive lenses and diffractive lenses, OPT COMMUN, 160(1-3), 1999, pp. 5-9
Authors:
De Nicola, S
Finizio, A
Ferraro, P
Pierattini, G
Citation: S. De Nicola et al., An interferometric technique based on Fourier fringe analysis for measuring the thermo-optic coefficients of transparent materials, OPT COMMUN, 159(4-6), 1999, pp. 203-207
Authors:
De Nicola, S
Ferraro, P
Finizio, A
Pierattini, G
Citation: S. De Nicola et al., Reflective grating interferometer: a folded reversal wave-front interferometer, APPL OPTICS, 38(22), 1999, pp. 4845-4849