Authors:
Pietralunga, SM
Martelli, P
Ferrario, M
Martinelli, M
Citation: Sm. Pietralunga et al., Measurement of self-phase modulation of amplified spontaneous emission: The role of second-order degree of coherence in determining the Kerr effect, IEEE PHOTON, 13(11), 2001, pp. 1179-1181
Authors:
Pietralunga, SM
Milani, A
Zappettini, A
Martinelli, M
Citation: Sm. Pietralunga et al., Experimental characterization of ternary Cd0.9Zn0.1Te as a basic material for all-optical processing in the 1.5-mu m range, J OPT SOC B, 18(2), 2001, pp. 176-181
Citation: Yqq. Qin et al., Quasi-phase-matched (QPM) difference frequency generation in a mirrorless counterpropagating configuration, J LIGHTW T, 19(9), 2001, pp. 1298-1306
Authors:
Bocchi, E
Milani, A
Zappettini, A
Pietralunga, SM
Martinelli, M
Citation: E. Bocchi et al., Determination of ionic and pure electronic contributions to the electro-optic coefficient of cadmium telluride and gallium arsenide single crystals, SYNTH METAL, 124(1), 2001, pp. 257-259
Authors:
Zappettini, A
Pietralunga, SM
Milani, A
Piccinin, D
Fere, M
Martinelli, M
Citation: A. Zappettini et al., Near-IR comparative characterization of optical second-order nonlinearities in Te-based semiconductors, J ELEC MAT, 30(6), 2001, pp. 738-742
Authors:
Pietralunga, SM
Tonini, A
Martelli, P
Ferrario, M
Martinelli, M
Citation: Sm. Pietralunga et al., Direct polarization-heterodyne measurement of Kerr-induced birefringence in optical fibers, IEEE PHOTON, 12(9), 2000, pp. 1231-1233
Authors:
Milani, A
Pietralunga, SM
Sangiovanni, A
Zappettini, A
Martinelli, M
Citation: A. Milani et al., Two-dimensional mapping of residual stress-induced birefringence in differently-grown semiconductors for optical communication applications, MAT SCI E A, 288(2), 2000, pp. 205-208
Authors:
Zappettini, A
Pietralunga, SM
Milani, A
Martinelli, M
Mycielski, A
Citation: A. Zappettini et al., Measurements of second-order susceptibility at lambda=1.5 mu m in CdTe-based ternary alloys for efficient wavelength conversion, J APPL PHYS, 88(8), 2000, pp. 4913-4915