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Results: 1-25 | 26-45 |
Results: 26-45/45
Competition of alignment and aggregation? Phenomena in constrained films of LC poly(olefin ulfone)s and maleic anhydride co- and terpolymers
Authors: Geue, TM Pietsch, U Haferkorn, JJ Stumple, J Date, RW Fawcett, AH
Citation: Tm. Geue et al., Competition of alignment and aggregation? Phenomena in constrained films of LC poly(olefin ulfone)s and maleic anhydride co- and terpolymers, MOL CRYST A, 329, 1999, pp. 725-731
Defect structure characterization of metal surfaces with induced phase changes of a coated ferroelectric liquid crystal
Authors: Chen, YC Geue, T Pietsch, U Manukow, S Schmeer, E
Citation: Yc. Chen et al., Defect structure characterization of metal surfaces with induced phase changes of a coated ferroelectric liquid crystal, MOL CRYST A, 329, 1999, pp. 1013-1016
X-ray diffraction from quantum wires and quantum dots
Authors: Zhuang, Y Stangl, J Darhuber, AA Bauer, G Mikulik, P Holy, V Darowski, N Pietsch, U
Citation: Y. Zhuang et al., X-ray diffraction from quantum wires and quantum dots, J MAT S-M E, 10(3), 1999, pp. 215-221
The energy-dispersive reflectometer diffractometer at BESSY-I
Authors: Neissendorfer, F Pietsch, U Brezesinski, G Mohwald, H
Citation: F. Neissendorfer et al., The energy-dispersive reflectometer diffractometer at BESSY-I, MEAS SCI T, 10(5), 1999, pp. 354-361
Investigation of molecular diffusion across organic multilayers using neutron specular reflectivity
Authors: Englisch, U Katholy, S Penacorada, F Reiche, J Pietsch, U
Citation: U. Englisch et al., Investigation of molecular diffusion across organic multilayers using neutron specular reflectivity, MAT SCI E C, 8-9, 1999, pp. 99-102
Chemical modification of Topaz surfaces
Authors: Struth, B Decher, G Schmitt, J Hofmeister, W Neissendorfer, F Pietsch, U Brezesinski, G Mohwald, H
Citation: B. Struth et al., Chemical modification of Topaz surfaces, MAT SCI E C, 10(1-2), 1999, pp. 97-101
X-ray and neutron reflection analysis of the structure and the molecular exchange process in simple and complex fatty acid salt Langmuir-Blodgett multilayers
Authors: Englisch, U Penacorada, F Brehmer, L Pietsch, U
Citation: U. Englisch et al., X-ray and neutron reflection analysis of the structure and the molecular exchange process in simple and complex fatty acid salt Langmuir-Blodgett multilayers, LANGMUIR, 15(5), 1999, pp. 1833-1841
Strain investigation of low strained buried gratings by grazing incidence X-ray diffraction and elasticity theory
Authors: Lubbert, D Baumbach, T Ponti, S Pietsch, U Leprince, L Schneck, J Talneau, A
Citation: D. Lubbert et al., Strain investigation of low strained buried gratings by grazing incidence X-ray diffraction and elasticity theory, EUROPH LETT, 46(4), 1999, pp. 479-485
X-ray scattering from silicon surfaces: a useful tool for quality control
Authors: Stommer, R Martin, AR Hub, W Gobel, H Pietsch, U
Citation: R. Stommer et al., X-ray scattering from silicon surfaces: a useful tool for quality control, MICROEL ENG, 45(2-3), 1999, pp. 257-263
Evaluation of strain distribution in freestanding and buried lateral nanostructures
Authors: Ulyanenkov, A Darowski, N Grenzer, J Pietsch, U Wang, KH Forchel, A
Citation: A. Ulyanenkov et al., Evaluation of strain distribution in freestanding and buried lateral nanostructures, PHYS REV B, 60(24), 1999, pp. 16701-16714
Experimental determination of electric-field-induced differences in structure-factor phases of the order of 2%
Authors: Stahn, J Pucher, A Pietsch, U Zellner, J Weckert, E
Citation: J. Stahn et al., Experimental determination of electric-field-induced differences in structure-factor phases of the order of 2%, ACT CRYST A, 55, 1999, pp. 1034-1037
High-resolution lattice parameter measurement by X-ray grazing incidence diffraction - Application to the interface of silicon on sapphire
Authors: Metzger, TH Pietsch, U Gartstein, E
Citation: Th. Metzger et al., High-resolution lattice parameter measurement by X-ray grazing incidence diffraction - Application to the interface of silicon on sapphire, PHYS ST S-A, 174(2), 1999, pp. 395-402
In situ characterization of strain distribution in broad-area high-power lasers under operation by high-resolution x-ray diffraction and topography using synchrotron radiation
Authors: Zeimer, U Baumbach, T Grenzer, J Lubbert, D Mazuelas, A Pietsch, U Erbert, G
Citation: U. Zeimer et al., In situ characterization of strain distribution in broad-area high-power lasers under operation by high-resolution x-ray diffraction and topography using synchrotron radiation, J PHYS D, 32(10A), 1999, pp. A123-A127
Strain relaxation in periodic arrays of Si SiGe quantum wires determined by coplanar high-resolution x-ray diffraction and grazing incidence diffraction
Authors: Zhuang, Y Holy, V Stangl, J Darhuber, AA Mikulik, P Zerlauth, S Schaffler, F Bauer, G Darowski, N Lubbert, D Pietsch, U
Citation: Y. Zhuang et al., Strain relaxation in periodic arrays of Si SiGe quantum wires determined by coplanar high-resolution x-ray diffraction and grazing incidence diffraction, J PHYS D, 32(10A), 1999, pp. A224-A229
Lateral arrangement of self-assembled quantum dots in an SiGe Si superlattice
Authors: Holy, V Stangl, J Zerlauth, S Bauer, G Darowski, N Lubbert, D Pietsch, U
Citation: V. Holy et al., Lateral arrangement of self-assembled quantum dots in an SiGe Si superlattice, J PHYS D, 32(10A), 1999, pp. A234-A238
Investigations of pH-dependent domain structure of lead arachidate Langmuir-Blodgett films by means of x-ray specular and diffuse scattering and atomic force microscopy
Authors: Geue, T Schultz, M Englisch, U Stommer, R Pietsch, U Meine, K Vollhardt, D
Citation: T. Geue et al., Investigations of pH-dependent domain structure of lead arachidate Langmuir-Blodgett films by means of x-ray specular and diffuse scattering and atomic force microscopy, J CHEM PHYS, 110(16), 1999, pp. 8104-8111
In-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]
Authors: Ulyanenkov, A Baumbach, T Darowski, N Pietsch, U Wang, KH Forchel, A Wiebach, T
Citation: A. Ulyanenkov et al., In-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001], J APPL PHYS, 85(3), 1999, pp. 1524-1530
Scanning system for high-energy electron diffractometry
Authors: Avilov, AS Kuligin, AK Pietsch, U Spence, JCH Tsirelson, VG Zuo, JM
Citation: As. Avilov et al., Scanning system for high-energy electron diffractometry, J APPL CRYS, 32, 1999, pp. 1033-1038
Electric-field-induced electron density response of GaAs and ZnSe
Authors: Stahn, J Pucher, A Geue, T Daniel, A Pietsch, U
Citation: J. Stahn et al., Electric-field-induced electron density response of GaAs and ZnSe, EUROPH LETT, 44(6), 1998, pp. 714-720
X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
Authors: Darowski, N Pietsch, U Wang, KH Forchel, A Shen, Q Kycia, S
Citation: N. Darowski et al., X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures, THIN SOL FI, 336(1-2), 1998, pp. 271-276
Risultati: 1-25 | 26-45 |