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Results: 1-25/31
Authors:
Powell, CJ
Beckman, EJ
Citation: Cj. Powell et Ej. Beckman, Design of ligands for the extraction of PtCl62- in introduction to liquid CO2, IND ENG RES, 40(13), 2001, pp. 2897-2903
Authors:
Powell, CJ
Jablonski, A
Citation: Cj. Powell et A. Jablonski, Influence of elastic-electron scattering on measurements of silicon dioxide film thicknesses by x-ray photoelectron spectroscopy, J VAC SCI A, 19(5), 2001, pp. 2604-2611
Authors:
Powell, CJ
Citation: Cj. Powell, Summary of the American society for testing and materials practice E 2108-00 for calibration of the electron binding-energy scale of an x-ray photoelectron spectrometer, J VAC SCI A, 19(5), 2001, pp. 2689-2690
Authors:
Powell, CJ
Jablonski, A
Naumkin, A
Kraut-Vass, A
Conny, JM
Rumble, JR
Citation: Cj. Powell et al., NIST data resources for surface analysis by X-ray photoelectron spectroscopy and Auger electron spectroscopy, J ELEC SPEC, 114, 2001, pp. 1097-1102
Authors:
Powell, CJ
Jablonski, A
Citation: Cj. Powell et A. Jablonski, Effects of elastic-electron scattering on measurements of silicon dioxide film thicknesses by X-ray photoelectron spectroscopy, J ELEC SPEC, 114, 2001, pp. 1139-1143
Authors:
Menyhard, M
Zsolt, G
Chen, PJ
Powell, CJ
McMichael, RD
Egelhoff, WF
Citation: M. Menyhard et al., Structural effects in the growth of giant magnetoresistance (GMR) spin valves, APPL SURF S, 180(3-4), 2001, pp. 315-321
Authors:
Egelhoff, WF
Chen, PJ
Powell, CJ
McMichael, RD
Stiles, MD
Citation: Wf. Egelhoff et al., Surface and interface effects in the growth of giant magnetoresistance spin valves for ultrahigh-density data-storage applications, PROG SURF S, 67(1-8), 2001, pp. 355-364
Authors:
Powell, CJ
Jablonski, A
Citation: Cj. Powell et A. Jablonski, Comparisons of calculated and measured effective attenuation lengths for silicon dioxide over a wide electron energy range, SURF SCI, 488(1-2), 2001, pp. L547-L552
Authors:
Egelhoff, WF
Chen, PJ
McMichael, RD
Powell, CJ
Deslattes, RD
Serpa, FG
Gomez, RD
Citation: Wf. Egelhoff et al., Surface oxidation as a diffusion barrier for Al deposited on ferromagneticmetals, J APPL PHYS, 89(9), 2001, pp. 5209-5214
Authors:
Lu, RP
Morgan, BA
Kavanagh, KL
Powell, CJ
Chen, PJ
Serpa, FG
Egelhoff, WF
Citation: Rp. Lu et al., Interfacial scattering of hot electrons in ultrathin Au/Co films, J VAC SCI B, 18(4), 2000, pp. 2047-2051
Authors:
Jablonski, A
Powell, CJ
Citation: A. Jablonski et Cj. Powell, Relationships between electron inelastic mean free paths, effective attenuation lengths, and mean escape depths (vol 100, pg 137, 1999), J ELEC SPEC, 107(2), 2000, pp. 201-201
Authors:
Conny, JM
Powell, CJ
Citation: Jm. Conny et Cj. Powell, Standard test data for estimating peak parameter errors in x-ray photoelectron spectroscopy: II. Peak intensities, SURF INT AN, 29(7), 2000, pp. 444-459
Authors:
Suzuki, M
Ando, H
Higashi, Y
Takenaka, H
Shimada, H
Matsubayashi, N
Imamura, M
Kurosawa, S
Tanuma, S
Powell, CJ
Citation: M. Suzuki et al., Experimental determination of electron effective attenuation lengths in silicon dioxide thin films using synchrotron radiation - I. Data analysis andcomparisons, SURF INT AN, 29(5), 2000, pp. 330-335
Authors:
Shimada, H
Matsubayashi, N
Imamura, M
Suzuki, M
Higashi, Y
Ando, H
Takenaka, H
Kurosawa, S
Tanuma, S
Powell, CJ
Citation: H. Shimada et al., Experimental determination of electron effective attenuation lengths in silicon dioxide thin films using synchrotron radiation - II. Effects of elastic scattering, SURF INT AN, 29(5), 2000, pp. 336-340
Authors:
Powell, CJ
Jablonski, A
Citation: Cj. Powell et A. Jablonski, Evaluation of electron inelastic mean free paths for selected elements andcompounds, SURF INT AN, 29(2), 2000, pp. 108-114
Authors:
Conny, JM
Powell, CJ
Citation: Jm. Conny et Cj. Powell, Standard test data for estimating peak parameter errors in x-ray photoelectron spectroscopy III. Errors with different curve-fitting approaches, SURF INT AN, 29(12), 2000, pp. 856-872
Authors:
Jablonski, A
Powell, CJ
Citation: A. Jablonski et Cj. Powell, Effects of interaction potential on elastic-electron-scattering parametersin surface-sensitive electron spectroscopies, SURF SCI, 463(1), 2000, pp. 29-54
Authors:
Lu, RP
Morgan, BA
Kavanagh, KL
Powell, CJ
Chen, PJ
Serpa, FG
Egelhoff, WF
Citation: Rp. Lu et al., Hot-electron attenuation lengths in ultrathin magnetic films, J APPL PHYS, 87(9), 2000, pp. 5164-5166
Authors:
Ratra, GS
Powell, CJ
Park, BK
Maggs, JL
Cottrell, S
Citation: Gs. Ratra et al., Methapyrilene hepatotoxicity is associated with increased hepatic glutathione, the formation of glucuronide conjugates, and enterohepatic recirculation, CHEM-BIO IN, 129(3), 2000, pp. 279-295
Authors:
Egelhoff, WF
Chen, PJ
Powell, CJ
Parks, D
Serpa, G
McMichael, RD
Martien, D
Berkowitz, AE
Citation: Wf. Egelhoff et al., Specular electron scattering in metallic thin films, J VAC SCI B, 17(4), 1999, pp. 1702-1707
Authors:
Powell, CJ
Jablonski, A
Citation: Cj. Powell et A. Jablonski, Consistency of calculated and measured electron inelastic mean free paths, J VAC SCI A, 17(4), 1999, pp. 1122-1126
Authors:
Powell, CJ
Jablonski, A
Tilinin, IS
Tanuma, S
Penn, DR
Citation: Cj. Powell et al., Surface sensitivity of Auger-electron spectroscopy and X-ray photoelectronspectroscopy, J ELEC SPEC, 99, 1999, pp. 1-15
Authors:
Jablonski, A
Powell, CJ
Citation: A. Jablonski et Cj. Powell, Relationships between electron inelastic mean free paths, effective attenuation lengths, and mean escape depths, J ELEC SPEC, 100, 1999, pp. 137-160
Authors:
Carstensen, J
Celleno, L
Claude, JR
Dony, J
Heistracher, P
Kapoulas, VM
Kemper, FH
Knaap, AGAC
Lina, BAR
Loprieno, N
Masse, MO
Masson, P
O'Mahony, DP
Monteiro-Rodrigues, LA
Juez, JLP
Pons-Gimier, L
Powell, CJ
Sainio, EL
Somogyi, A
Tammela, M
White, IR
Citation: J. Carstensen et al., European Commission - Directorate general DG XXIV consumer policy and consumer health protection - Notes of guidance for testing of cosmetic ingredients for their safety evaluation (second revision), FOOD CHEM T, 37(4), 1999, pp. 357-385
Authors:
Powell, CJ
Shimizu, R
Citation: Cj. Powell et R. Shimizu, Summary of ISO TC 201 standards: Introduction, SURF INT AN, 27(7), 1999, pp. 691-692