Authors: Wilkinson, DK Loveday, DA Prutton, M

Citation: Dk. Wilkinson et al., Nondestructive angle-resolved X-ray depth profiling: Interpretation of angle-resolved profiles using a Monte Carlo approach, MICROS MICR, 6(6), 2000, pp. 517-531

Authors: Prutton, M

Citation: M. Prutton, From LEED to MULSAM, SURF INT AN, 29(9), 2000, pp. 561-571

Authors: Prutton, M Wilkinson, DK Loveday, DA

Citation: M. Prutton et al., Quantitative AES-mapping and depth profiling, MIKROCH ACT, 132(2-4), 2000, pp. 225-236

Authors: Prutton, M Wilkinson, DK Kenny, PG Mountain, DL

Citation: M. Prutton et al., Data processing for spectrum-images: extracting information from the data mountain, APPL SURF S, 145, 1999, pp. 1-10

Authors: Wilkinson, DK El-Gomati, M Prutton, M Cooke, GA Dowsett, MG Smith, NS

Citation: Dk. Wilkinson et al., Study of altered layer formation in O-2(+)-bombarded SiGe alloys using a novel crossed bevel technique, SURF INT AN, 27(9), 1999, pp. 840-848

Authors: Jacka, M Kirk, M El Gomati, MM Prutton, M

Citation: M. Jacka et al., A fast, parallel acquisition, electron energy analyzer: The hyperbolic field analyzer, REV SCI INS, 70(5), 1999, pp. 2282-2287