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Results: 3

Authors: Picard, C Brisset, C Quittard, O Marceau, M Hoffmann, A Joffre, F Charles, JP
Citation: C. Picard et al., Use of commercial VDMOSFETs in electronic systems subjected to radiation, IEEE NUCL S, 47(3), 2000, pp. 627-633

Authors: Picard, C Brisset, C Quittard, O Hoffmann, A Joffre, F Charles, JP
Citation: C. Picard et al., Radiation hardening of power MOSFETs using electrical stress, IEEE NUCL S, 47(3), 2000, pp. 641-646

Authors: Quittard, O Joffre, F Brisset, C Oudea, C Saigne, F Dusseau, L Fesquet, J Gasiot, J
Citation: O. Quittard et al., Use of the radiation-induced charge neutralization mechanism to achieve annealing of 0.35 mu m SRAMs, IEEE NUCL S, 46(6), 1999, pp. 1633-1639
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