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Citation: I. Esquivias et al., CARRIER CAPTURE AND ESCAPE TIMES IN IN0.35GA0.65AS-GAAS MULTI-QUANTUM-WELL LASERS DETERMINED FROM HIGH-FREQUENCY ELECTRICAL-IMPEDANCE MEASUREMENTS, IEEE photonics technology letters, 8(10), 1996, pp. 1294-1296
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Citation: Re. Sah et al., FABRICATION OF DRY-ETCHED MIRRORS IN GAAS-BASED AND INP-BASED LASERS USING CHEMICALLY ASSISTED ION-BEAM ETCHING AT LOW-TEMPERATURES, Journal of electronic materials, 25(9), 1996, pp. 1446-1450
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Citation: K. Czotscher et al., STRUCTURAL AND CARRIER DENSITY-DEPENDENCE OF CARRIER LIFETIME IN INGAAS GAAS MULTIPLE-QUANTUM-WELL LASERS/, Applied physics letters, 69(21), 1996, pp. 3158-3160
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Citation: J. Daleiden et al., CHEMICAL-ANALYSIS OF A CL-2 BCL3/IBR3 CHEMICALLY ASSISTED ION-BEAM ETCHING PROCESS FOR GAAS AND INP LASER-MIRROR FABRICATION UNDER CRYO-PUMPED ULTRAHIGH-VACUUM CONDITIONS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(5), 1995, pp. 2022-2024
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Citation: J. Schmitz et al., OPTICAL AND STRUCTURAL INVESTIGATIONS OF INTERMIXING REACTIONS AT THEINTERFACES OF INAS ALSB AND INAS/GASB QUANTUM-WELLS GROWN BY MOLECULAR-BEAM EPITAXY/, Journal of crystal growth, 150(1-4), 1995, pp. 858-862
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Citation: S. Ehret et al., TUNNELING ASSISTED THERMIONIC EMISSION IN DOUBLE-BARRIER QUANTUM-WELLSTRUCTURES, Journal of applied physics, 77(6), 1995, pp. 2537-2543
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