AAAAAA
Results: 26-32/32
Authors:
METRA C
RICCO B
Citation: C. Metra et B. Ricco, ENHANCED RELIABILITY EVALUATION FOR SELF-CHECKING CIRCUITS, Electronics Letters, 30(10), 1994, pp. 776-778
Authors:
ABRAMO A
VENTURI F
SANGIORGI E
HIGMAN JM
RICCO B
Citation: A. Abramo et al., A NUMERICAL-METHOD TO COMPUTE ISOTROPIC BAND MODELS FROM ANISOTROPIC SEMICONDUCTOR BAND STRUCTURES, IEEE transactions on computer-aided design of integrated circuits and systems, 12(9), 1993, pp. 1327-1336
Authors:
DALPASSO M
FAVALLI M
OLIVO P
RICCO B
Citation: M. Dalpasso et al., FAULT SIMULATION OF PARAMETRIC BRIDGING FAULTS IN CMOS ICS, IEEE transactions on computer-aided design of integrated circuits and systems, 12(9), 1993, pp. 1403-1410
Authors:
LANZONI M
SUNE J
OLIVO P
RICCO B
Citation: M. Lanzoni et al., ADVANCED ELECTRICAL-LEVEL MODELING OF EEPROM CELLS, I.E.E.E. transactions on electron devices, 40(5), 1993, pp. 951-957
Authors:
LANZONI M
FAVALLI M
AMBANELLI M
OLIVO P
RICCO B
Citation: M. Lanzoni et al., AN EXPERIMENTAL-STUDY OF TESTING TECHNIQUES FOR BRIDGING FAULTS IN CMOS ICS, IEEE journal of solid-state circuits, 28(6), 1993, pp. 686-690
Authors:
SELMI L
RICCO B
Citation: L. Selmi et B. Ricco, DESIGN OF AN X-BAND TRANSFORMER-COUPLED AMPLIFIER WITH IMPROVED STABILITY AND LAYOUT, IEEE journal of solid-state circuits, 28(6), 1993, pp. 701-703
Authors:
ABRAMO A
VENTURI F
SANGIORGI E
FIEGNA C
RICCO B
BRUNETTI R
QUADE W
JACOBONI C
Citation: A. Abramo et al., A MULTIBAND MODEL FOR HOLE TRANSPORT IN SILICON AT HIGH-ENERGIES, Semiconductor science and technology, 7(3B), 1992, pp. 597-600