Authors:
ZANORIA ES
WATKINS TR
BREDER K
RIESTER L
BASHKANSKY M
REINTJES J
SUN JG
ELLINGSON WA
BLAU PJ
Citation: Es. Zanoria et al., ASSESSMENT OF TECHNIQUES FOR CHARACTERIZING THE SURFACE QUALITY OF GROUND SILICON-NITRIDE, Journal of materials engineering and performance, 7(4), 1998, pp. 533-547
Citation: J. Li et al., AN INVESTIGATION OF THIN-FILM COATING SUBSTRATE SYSTEMS BY NANOINDENTATION/, Journal of engineering materials and technology, 120(2), 1998, pp. 154-162
Authors:
WILLIAMS JM
RIESTER L
PANDEY R
EBERHARDT AW
Citation: Jm. Williams et al., PROPERTIES OF NITROGEN-IMPLANTED ALLOYS AND COMPARISON MATERIALS, Surface & coatings technology, 88(1-3), 1997, pp. 132-138
Citation: Dh. Lee et al., THE EFFECT OF IMPLANTATION TEMPERATURE ON THE SURFACE HARDNESS, ELASTIC-MODULUS AND RAMAN-SCATTERING IN AMORPHOUS-CARBON, Applied physics letters, 70(23), 1997, pp. 3104-3106
Authors:
USLU C
LEE DH
BERTA Y
PARK B
POKER DB
RIESTER L
Citation: C. Uslu et al., ENHANCED SURFACE HARDNESS IN NITROGEN-IMPLANTED SILICON-CARBIDE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 693-697
Authors:
FOUGERE GE
RIESTER L
FERBER M
WEERTMAN JR
SIEGEL RW
Citation: Ge. Fougere et al., YOUNGS MODULUS OF NANOCRYSTALLINE FE MEASURED BY NANOINDENTATION, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 204(1-2), 1995, pp. 1-6