Authors: ROUT B GHOSE SK SUNDARAVEL B KURI G MAHAPATRA DP DEV BN SEN P BAKHRU H HABERL AW

Citation: B. Rout et al., MICRO ION-BEAM FACILITY AT THE INSTITUTE-OF-PHYSICS, BHUBANESWAR, Radiation physics and chemistry, 51(4-6), 1998, pp. 677-677

Authors: DEY S KURI G ROUT B VARMA S

Citation: S. Dey et al., RANGE PROFILES AND LATTICE LOCATION OF MEV IMPLANT OF SB IN SI(100), Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 142(1-2), 1998, pp. 35-42

Authors: KUMAR A HABERL A BAKHRU H ROUT B

Citation: A. Kumar et al., IMPROVED HIGH-ENERGY MICROBEAM TECHNIQUES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 219-223

Authors: KURI G ROUT B SUNDARAVEL B MAHAPATRA DP DEV BN

Citation: G. Kuri et al., EFFECT OF MEV AU ION-IMPLANTATION ON THE COMPOSITION OF GAAS UPON VACUUM ANNEALING - PIXE AND XRF STUDIES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 119(3), 1996, pp. 403-410

Authors: KURI G SUNDARAVEL B ROUT B MAHAPATRA DP DEV BN

Citation: G. Kuri et al., MEV AS AND AU ION-IMPLANTATION IN SI, GAP, GAAS, INSB AND LINBO3 - STUDY OF RANGE AND LATTICE LOCATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 111(3-4), 1996, pp. 234-243

Authors: SATYAM PV BAHR D GHOSE SK KURI G SUNDARAVEL B ROUT B DEV BN

Citation: Pv. Satyam et al., A HIGH-PRECISION TECHNIQUE USING X-RAY REFLECTIVITY FOR THE MEASUREMENT OF SURFACE AND INTERFACE ROUGHNESS, Current Science, 69(6), 1995, pp. 526-529