Authors: RUDENKO TE KILCHITSKAYA VI RUDENKO AN

Citation: Te. Rudenko et al., DIFFUSION-MODEL FOR HIGH-TEMPERATURE OFF-STATE CURRENTS IN SOI MOSFETS, Microelectronic engineering, 36(1-4), 1997, pp. 367-370

Authors: BARCHUK IP KILCHITSKAYA VI LYSENKO VS NAZAROV AN RUDENKO TE DJURENKO SV RUDENKO AN YURCHENKO AP BALLUTAUD D COLINGE JP

Citation: Ip. Barchuk et al., ELECTRICAL-PROPERTIES AND RADIATION HARDNESS OF SOI SYSTEMS WITH MULTILAYER BURIED DIELECTRIC, IEEE transactions on nuclear science, 44(6), 1997, pp. 2542-2552

Authors: RUDENKO TE RUDENKO AN NAZAROV AN LYSENKO VS

Citation: Te. Rudenko et al., CHARACTERIZATION OF SOI BY CAPACITANCE AND CURRENT MEASUREMENTS WITH COMBINED GATED DIODE AND DEPLETION-MODE MOSFET STRUCTURE, Microelectronic engineering, 28(1-4), 1995, pp. 475-478