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Results: 1-21 |
Results: 21

Authors: Lokker, JP Bottger, AJ Sloof, WG Tichelaar, FD Janssen, GCAM Radelaar, S
Citation: Jp. Lokker et al., Phase transformations in Al-Cu thin films: Precipitation and copper redistribution, ACT MATER, 49(8), 2001, pp. 1339-1349

Authors: van Gorkom, RP Caro, J Klapwijk, TM Radelaar, S
Citation: Rp. Van Gorkom et al., Temperature and angular dependence of the anisotropic magnetoresistance inepitaxial Fe films - art. no. 134432, PHYS REV B, 6313(13), 2001, pp. 4432

Authors: Theeuwen, SJCH Caro, J Schreurs, KI van Gorkom, RP Wellock, KP Gribov, NN Radelaar, S Jungblut, RM Oepts, W Coehoorn, R Kozub, VI
Citation: Sjch. Theeuwen et al., Negative resistance contribution of a domain-wall structure in a constricted geometry, J APPL PHYS, 89(8), 2001, pp. 4442-4453

Authors: Onipko, AI Berggren, KF Klymenko, YO Malysheva, LI Rosink, JJWM Geerligs, LJ van der Drift, E Radelaar, S
Citation: Ai. Onipko et al., Scanning tunneling spectroscopy on pi-conjugated phenyl-based oligomers: Asimple physical model, PHYS REV B, 61(16), 2000, pp. 11118-11124

Authors: van Veen, RG Verbruggen, AH van der Drift, E Schaffler, F Radelaar, S
Citation: Rg. Van Veen et al., Magnetoresistance fluctuations in short n-type Si/SiGe heterostructure wires, PHYS REV B, 61(11), 2000, pp. 7545-7552

Authors: Lukey, PW Caro, J Zijlstra, T van der Drift, E Radelaar, S
Citation: Pw. Lukey et al., The influence of strain relaxation on the electrical properties of submicron Si/SiGe resonant-tunneling diodes, ANALOG IN C, 24(1), 2000, pp. 27-35

Authors: Rosink, JJWM Blauw, MA Geerligs, LJ van der Drift, E Rousseeuw, BAC Radelaar, S Sloof, WG Fakkeldij, EJM
Citation: Jjwm. Rosink et al., Self-assembly of pi-conjugated azomethine oligomers by sequential deposition of monomers from solution, LANGMUIR, 16(10), 2000, pp. 4547-4553

Authors: Lokker, JP Janssen, GCAM Radelaar, S
Citation: Jp. Lokker et al., The influence of the passivation material on stress voiding in Al-Cu alloys, MICROEL ENG, 50(1-4), 2000, pp. 257-263

Authors: Rosink, JJWM Blauw, MA Geerligs, LJ van der Drift, E Radelaar, S
Citation: Jjwm. Rosink et al., Tunneling spectroscopy study and modeling of electron transport in small conjugated azomethine molecules, PHYS REV B, 62(15), 2000, pp. 10459-10466

Authors: Lokker, JP van der Pers, NM Verbruggen, AH Janssen, GCAM Jongste, JF Radelaar, S
Citation: Jp. Lokker et al., Localized stress near and the thermal expansion of Al2Cu precipitates in an Al thin film matrix, J APPL PHYS, 87(2), 2000, pp. 682-688

Authors: Theeuwen, SJCH Caro, J Radelaar, S Canali, L Kouwenhoven, LP Marrows, CH Hickey, BJ
Citation: Sjch. Theeuwen et al., Local probing of the giant magnetoresistance, APPL PHYS L, 77(15), 2000, pp. 2370-2372

Authors: Rosink, JJWM Blauw, MA Geerligs, LJ van der Drift, E Rousseeuw, BAC Radelaar, S
Citation: Jjwm. Rosink et al., Growth and scanning tunneling spectroscopy of self-assembled pi-conjugatedoligomers, MAT SCI E C, 8-9, 1999, pp. 267-272

Authors: van Veen, RG Verbruggen, AH van der Drift, E Schaffler, F Radelaar, S
Citation: Rg. Van Veen et al., Experimental study on magnetoresistance phenomena in n-type Si SiGe quantum wires, SEMIC SCI T, 14(6), 1999, pp. 508-516

Authors: Wellock, K Theeuwen, SJCH Caro, J Gribov, NN van Gorkom, RP Radelaar, S Tichelaar, FD Hickey, BJ Marrows, CH
Citation: K. Wellock et al., Giant magnetoresistance of magnetic multilayer point contacts, PHYS REV B, 60(14), 1999, pp. 10291-10301

Authors: van Veen, RG Verbruggen, AH van der Drift, E Radelaar, S Anders, S Jaeger, HM
Citation: Rg. Van Veen et al., Micron-sized Hall probes on a Si/SiGe heterostructure as a tool to study vortex dynamics in high-temperature superconducting crystals, REV SCI INS, 70(3), 1999, pp. 1767-1770

Authors: van Gorkom, RP Theeuwen, SJCH Wellock, KP Gribov, NN Caro, J Radelaar, S
Citation: Rp. Van Gorkom et al., Role of boundary conditions and dimensions on the micromagnetics of a cobalt point contact, J APPL PHYS, 85(8), 1999, pp. 6196-6198

Authors: Jongste, JF Oosterlaken, TGM Janssen, GCAM Radelaar, S
Citation: Jf. Jongste et al., Influence of SiH2Cl2 on the kinetics of the chemical vapor deposition of tungsten by SiH4 reduction of WF6, J ELCHEM SO, 146(1), 1999, pp. 167-169

Authors: Theeuwen, SJCH Caro, J Wellock, KP Radelaar, S Marrows, CH Hickey, BJ Kozub, VI
Citation: Sjch. Theeuwen et al., Nanoconstriction microscopy of the giant magnetoresistance in cobalt/copper spin valves, APPL PHYS L, 75(23), 1999, pp. 3677-3679

Authors: van Gorkom, RP Caro, J Theeuwen, SJCH Wellock, KP Gribov, NN Radelaar, S
Citation: Rp. Van Gorkom et al., Micromagnetics and magnetoresistance of a Permalloy point contact, APPL PHYS L, 74(3), 1999, pp. 422-424

Authors: Janssen, GCAM Jongste, JF Verbruggen, AH Radelaar, S Barth, HJ Robl, W
Citation: Gcam. Janssen et al., The role of the TiN liner in forcefill, EL SOLID ST, 1(2), 1998, pp. 97-99

Authors: Bisch, C Boellaard, E Janssen, GCAM Alkemade, PFA Radelaar, S
Citation: C. Bisch et al., Orientation of aluminum nuclei on Si(100) and Si(111), THIN SOL FI, 336(1-2), 1998, pp. 84-88
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