Authors:
Renault, PO
Badawi, KF
Goudeau, P
Bimbault, L
Citation: Po. Renault et al., An experimental method for measuring the Poisson's ratio in thin films andmultilayers using a tensile machine set up on an X-ray goniometer, EPJ-APPL PH, 10(2), 2000, pp. 91-96
Authors:
Villain, P
Renault, PO
Goudeau, P
Badawi, KF
Citation: P. Villain et al., Analysis of elastic properties of Ni/Mo multilayers when coupling a tensile tester to an X-ray diffractometer, J PHYS IV, 10(P10), 2000, pp. 163-170
Authors:
Gaboriaud, RJ
Pailloux, F
Pacaud, J
Renault, PO
Perriere, J
Huignard, A
Citation: Rj. Gaboriaud et al., Microstructural investigations of Y2O3 thin films deposited by laser ablation on MgO, APPL PHYS A, 71(6), 2000, pp. 675-680
Citation: P. Leveque et al., Influence of extended structural defects on the effective carrier concentration of p-type Hg0.78Cd0.22Te implanted with aluminium ions, NUCL INST B, 168(1), 2000, pp. 40-46