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Results: 1-7 |
Results: 7

Authors: Goudeau, P Renault, PO Badawi, KF Villain, P
Citation: P. Goudeau et al., X-ray diffraction analysis residual stresses and elasticity constants in thin films, VIDE, 56(301), 2001, pp. 541

Authors: Chin, KJ Zaidi, H Nguyen, MT Renault, PO
Citation: Kj. Chin et al., Tribological behavior and surface analysis of magnetized sliding contact XC 48 steel/XC 48 steel, WEAR, 250, 2001, pp. 470-476

Authors: Renault, PO Badawi, KF Goudeau, P Bimbault, L
Citation: Po. Renault et al., An experimental method for measuring the Poisson's ratio in thin films andmultilayers using a tensile machine set up on an X-ray goniometer, EPJ-APPL PH, 10(2), 2000, pp. 91-96

Authors: Villain, P Renault, PO Goudeau, P Badawi, KF
Citation: P. Villain et al., Analysis of elastic properties of Ni/Mo multilayers when coupling a tensile tester to an X-ray diffractometer, J PHYS IV, 10(P10), 2000, pp. 163-170

Authors: Gaboriaud, RJ Pailloux, F Pacaud, J Renault, PO Perriere, J Huignard, A
Citation: Rj. Gaboriaud et al., Microstructural investigations of Y2O3 thin films deposited by laser ablation on MgO, APPL PHYS A, 71(6), 2000, pp. 675-680

Authors: Leveque, P Declemy, A Renault, PO
Citation: P. Leveque et al., Influence of extended structural defects on the effective carrier concentration of p-type Hg0.78Cd0.22Te implanted with aluminium ions, NUCL INST B, 168(1), 2000, pp. 40-46

Authors: Rebeyrat, S Grosseau-Poussard, JL Dinhut, JF Renault, PO
Citation: S. Rebeyrat et al., Oxidation of phosphated iron powders, THIN SOL FI, 379(1-2), 2000, pp. 139-146
Risultati: 1-7 |