Authors:
Letzkus, F
Butschke, J
Irmscher, M
Reuter, C
Springer, R
Eder, S
Loschner, H
Eberhardt, R
Mohaupt, M
Ehrmann, A
Mathuni, J
Panzer, B
Struck, T
Citation: F. Letzkus et al., Reference plate manufacturing process for the ion projection lithography pattern lock system, MICROEL ENG, 57-8, 2001, pp. 213-218
Authors:
Lockwood, JA
Schell, SP
Foster, RN
Reuter, C
Rachad, T
Citation: Ja. Lockwood et al., Reduced agent-area treatments (RAAT) for management of rangeland grasshoppers: efficacy and economics under operational conditions, INT J PEST, 46(1), 2000, pp. 29-42
Citation: H. Winking et al., Unequal nondisjunction frequencies of trivalent chromosomes in male mice heterozygous for two Robertsonian translocations, CYTOG C GEN, 91(1-4), 2000, pp. 303-306
Authors:
Reiter, W
Stieber, P
Reuter, C
Nagel, D
Lau-Werner, U
Lamerz, R
Citation: W. Reiter et al., Multivariate analysis of the prognostic value of CEA and CA 19-9 serum levels in colorectal cancer, ANTICANC R, 20(6D), 2000, pp. 5195-5198
Authors:
Letzkus, F
Butschke, J
Hofflinger, B
Irmscher, M
Reuter, C
Springer, R
Ehrmann, A
Mathuni, J
Citation: F. Letzkus et al., Dry etch improvements in the SOI Wafer Flow Process for IPL stencil mask fabrication, MICROEL ENG, 53(1-4), 2000, pp. 609-612
Citation: Gm. Hubner et al., Rotaxane synthesis via nucleophilic substitution reactions: The trapping of electrophilic threads by organic anion-wheel complexes, SYNTHESIS-S, (1), 2000, pp. 103-108
Authors:
Elian, K
Irmscher, M
Butschke, J
Letzkus, F
Reuter, C
Springer, R
Citation: K. Elian et al., Comparative evaluation of electron-beam sensitive single layer top surfaceimaging and bilayer chemical amplification of resist lines process for stencil mask making, J VAC SCI B, 17(6), 1999, pp. 3122-3126
Authors:
Reuter, C
Wienand, W
Hubner, GM
Seel, C
Vogtle, F
Citation: C. Reuter et al., High-yield synthesis of ester, carbonate, and acetal rotaxanes by anion template assistance and their hydrolytic dethreading, CHEM-EUR J, 5(9), 1999, pp. 2692-2697