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Results:
1-7
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Results: 7
Authors:
Puers, R
Reyntjens, S
De Bruyker, D
Citation: R. Puers et al., Remote sensors with self-test: New opportunities to improve the performance of physical transducers, ADV ENG MAT, 3(10), 2001, pp. 788-795
Authors:
Vlaminck, H
Maes, B
Jacobs, A
Reyntjens, S
Evers, G
Citation: H. Vlaminck et al., The dialysis diet and fluid non-adherence questionnaire: validity testing of a self-report instrument for clinical practice, J CLIN NURS, 10(5), 2001, pp. 707-714
Authors:
Reyntjens, S
Puers, R
Citation: S. Reyntjens et R. Puers, A review of focused ion beam applications in microsystem technology, J MICROM M, 11(4), 2001, pp. 287-300
Authors:
Puers, R
Reyntjens, S
Citation: R. Puers et S. Reyntjens, Fabrication and testing of custom vacuum encapsulations deposited by focused ion beam direct-write CVD, SENS ACTU-A, 92(1-3), 2001, pp. 249-256
Authors:
Reyntjens, S
Puers, R
Citation: S. Reyntjens et R. Puers, Focused ion beam induced deposition: fabrication of three-dimensional microstructures and Young's modulus of the deposited material, J MICROM M, 10(2), 2000, pp. 181-188
Authors:
Reynaerts, D
Meeusen, W
Song, XZ
Van Brussel, H
Reyntjens, S
De Bruyker, D
Puers, R
Citation: D. Reynaerts et al., Integrating electro-discharge machining and photolithography: work in progress, J MICROM M, 10(2), 2000, pp. 189-195
Authors:
Reynaerts, D
Meeusen, W
Van Brussel, H
Reyntjens, S
Puers, R
Citation: D. Reynaerts et al., Production of seismic mass suspensions in silicon by electro-discharge machining, J MICROM M, 9(2), 1999, pp. 206-210
Risultati:
1-7
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