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Results: 1-11 |
Results: 11
Effects of chronic, post-injury Cyclosporin A administration on motor and sensorimotor function following severe, experimental traumatic brain injury
Authors: Riess, P Bareyre, FM Saatman, KE Cheney, JA Lifshitz, J Raghupathi, R Grady, MS Neugebauer, E McIntosh, TK
Citation: P. Riess et al., Effects of chronic, post-injury Cyclosporin A administration on motor and sensorimotor function following severe, experimental traumatic brain injury, REST NEUROL, 18(1), 2001, pp. 1-8
A review and rationale for the use of genetically engineered animals in the study of traumatic brain injury
Authors: Longhi, L Saatman, KE Raghupathi, R Laurer, HL Lenzlinger, PM Riess, P Neugebauer, E Trojanowski, JQ Lee, VMY Grady, MS Graham, DI McIntosh, TK
Citation: L. Longhi et al., A review and rationale for the use of genetically engineered animals in the study of traumatic brain injury, J CEREBR B, 21(11), 2001, pp. 1241-1258
The effect of additional brain injury on systemic interleukin (IL)-10 and IL-13 levels in trauma patients
Authors: Hensler, T Sauerland, S Riess, P Hess, S Helling, HJ Andermahr, J Bouillon, B Neugebauer, EAM
Citation: T. Hensler et al., The effect of additional brain injury on systemic interleukin (IL)-10 and IL-13 levels in trauma patients, INFLAMM RES, 49(10), 2000, pp. 524-528
Electrically and radiation induced leakage currents in thin oxides
Authors: Scarpa, A Riess, P Ghibaudo, G Paccagnella, A Pananakakis, G Ceschia, M Ghidini, G
Citation: A. Scarpa et al., Electrically and radiation induced leakage currents in thin oxides, MICROEL REL, 40(1), 2000, pp. 57-67
Stress-induced leakage current generation kinetics based on anode hole injection and hole dispersive transport
Authors: Riess, P Ghibaudo, G Pananakakis, G
Citation: P. Riess et al., Stress-induced leakage current generation kinetics based on anode hole injection and hole dispersive transport, J APPL PHYS, 87(9), 2000, pp. 4626-4628
Comparison of the electrical and thermal stability of stress- or radiation-induced leakage current in thin oxides
Authors: Riess, P Ceschia, M Paccagnella, A Ghibaudo, G Pananakakis, G
Citation: P. Riess et al., Comparison of the electrical and thermal stability of stress- or radiation-induced leakage current in thin oxides, APPL PHYS L, 76(9), 2000, pp. 1158-1160
Emerging oxide degradation mechanisms: Stress induced leakage current (SILC) and quasi-breakdown (QB)
Authors: Ghibaudo, G Riess, P Bruyere, S DeSalvo, B Jahan, C Scarpa, A Pananakakis, G Vincent, E
Citation: G. Ghibaudo et al., Emerging oxide degradation mechanisms: Stress induced leakage current (SILC) and quasi-breakdown (QB), MICROEL ENG, 49(1-2), 1999, pp. 41-50
Modelling of the temperature and electric field dependence of substrate/gate current SILC with an elastic resonant trap assisted tunnelling mechanism
Authors: Riess, P Ghibaudo, G Pananakakis, G
Citation: P. Riess et al., Modelling of the temperature and electric field dependence of substrate/gate current SILC with an elastic resonant trap assisted tunnelling mechanism, MICROEL REL, 39(6-7), 1999, pp. 803-807
Measurement and modeling of the annealing kinetics of stress induced leakage current in ultra-thin oxides
Authors: Riess, P Ghibaudo, G Pananakakis, G Brini, J
Citation: P. Riess et al., Measurement and modeling of the annealing kinetics of stress induced leakage current in ultra-thin oxides, MICROEL REL, 39(2), 1999, pp. 203-207
Electric field and temperature dependence of the stress induced leakage current: Fowler-Nordheim or Schottky emission?
Authors: Riess, P Ghibaudo, G Pananakakis, G Brini, J Ghidini, G
Citation: P. Riess et al., Electric field and temperature dependence of the stress induced leakage current: Fowler-Nordheim or Schottky emission?, J NON-CRYST, 245, 1999, pp. 48-53
Analysis of the stress-induced leakage current and related trap distribution
Authors: Riess, P Ghibaudo, G Pananakakis, G
Citation: P. Riess et al., Analysis of the stress-induced leakage current and related trap distribution, APPL PHYS L, 75(24), 1999, pp. 3871-3873
Risultati: 1-11 |