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Results: 1-11 |
Results: 11

Authors: Fumeron, F Betoulle, D Aubert, R Herbeth, B Siest, G Rigaud, D
Citation: F. Fumeron et al., Association of a functional 5-HT transporter gene polymorphism with anorexia nervosa and food intake, MOL PSYCHI, 6(1), 2001, pp. 9-10

Authors: Bizeul, C Sadowsky, N Rigaud, D
Citation: C. Bizeul et al., The prognostic value of initial EDI scores in anorexia nervosa patients: aprospective follow-up study of 5-10 years, EUR PSYCHIA, 16(4), 2001, pp. 232-238

Authors: Rhayem, J Rigaud, D Eya'a, A Valenza, M Hoffmann, A
Citation: J. Rhayem et al., 1/f noise in metal-oxide-semiconductor transistors biased in weak inversion, J APPL PHYS, 89(7), 2001, pp. 4192-4194

Authors: Senault, C Betoulle, D Luc, G Hauw, P Rigaud, D Fumeron, F
Citation: C. Senault et al., Beneficial effects of a moderate consumption of red wine on cellular cholesterol efflux in young men, NUTR MET CA, 10(2), 2000, pp. 63-69

Authors: Mercha, A Rhayem, J Pichon, L Valenza, M Routoure, JM Carin, R Bonnaud, O Rigaud, D
Citation: A. Mercha et al., Low-frequency noise in low temperature unhydrogenated polysilicon thin film transistors, MICROEL REL, 40(11), 2000, pp. 1891-1896

Authors: Vildeuil, JC Valenza, M Rigaud, D
Citation: Jc. Vildeuil et al., Low frequency noise in gate and drain of PHEMT's and related correlation, MICROEL REL, 40(11), 2000, pp. 1915-1920

Authors: Rhayem, J Rigaud, D Valenza, M Szydlo, N Lebrun, H
Citation: J. Rhayem et al., 1/f noise modeling in long channel amorphous silicon thin film transistors, J APPL PHYS, 87(4), 2000, pp. 1983-1989

Authors: Rigaud, D
Citation: D. Rigaud, Anorexia nervosa: a model of malnutrition., ANN MED IN, 151(7), 2000, pp. 549-555

Authors: Rigaud, D Hassid, J Meulemans, A Poupard, AT Boulier, A
Citation: D. Rigaud et al., A paradoxical increase in resting energy expenditure in malnourished patients near death: the king penguin syndrome, AM J CLIN N, 72(2), 2000, pp. 355-360

Authors: Rhayem, J Rigaud, D Valenza, M Szydlo, N Lebrun, H
Citation: J. Rhayem et al., 1/f noise in amorphous silicon thin film transistors: effect of scaling down, SOL ST ELEC, 43(4), 1999, pp. 713-721

Authors: Vildeuil, JC Valenza, M Rigaud, D
Citation: Jc. Vildeuil et al., Extraction of the BSIM3 1/f noise parameters in CMOS transistors, MICROELEC J, 30(2), 1999, pp. 199-205
Risultati: 1-11 |