Authors:
Tiedke, S
Schmitz, T
Prume, K
Roelofs, A
Schneller, T
Kall, U
Waser, R
Ganpule, CS
Nagarajan, V
Stanishevsky, A
Ramesh, R
Citation: S. Tiedke et al., Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope, APPL PHYS L, 79(22), 2001, pp. 3678-3680
Authors:
Roelofs, A
Bottger, U
Waser, R
Schlaphof, F
Trogisch, S
Eng, LM
Citation: A. Roelofs et al., Differentiating 180 degrees and 90 degrees switching of ferroelectric domains with three-dimensional piezoresponse force microscopy, APPL PHYS L, 77(21), 2000, pp. 3444-3446
Citation: A. Roelofs et al., A case for the lemma/lexeme distinction in models of speaking: comment on Caramazza and Miozzo (1997), COGNITION, 69(2), 1998, pp. 219-230