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Results:
1-9
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Results: 9
Authors:
Gilet, P
Grenouillet, L
Duvaut, P
Ballet, P
Rolland, G
Vannuffel, C
Million, A
Citation: P. Gilet et al., Growth and characterization of GaInNAs/GaAs multiquantum wells, J VAC SCI B, 19(4), 2001, pp. 1422-1425
Authors:
Ermolieff, A
Chabli, A
Pierre, F
Rolland, G
Rouchon, D
Vannuffel, C
Vergnaud, C
Baylet, J
Semeria, MN
Citation: A. Ermolieff et al., XPS, Raman spectroscopy, X-ray diffraction, specular X-ray reflectivity, transmission electron microscopy and elastic recoil detection analysis of emissive carbon film characterization, SURF INT AN, 31(3), 2001, pp. 185-190
Authors:
Sabatini, M
Thomas, M
Deschamps, C
Lesur, C
Rolland, G
de Nanteuil, G
Bonnet, J
Citation: M. Sabatini et al., Effects of ceramide on aggrecanase activity in rabbit articular cartilage, BIOC BIOP R, 283(5), 2001, pp. 1105-1110
Authors:
Barge, D
Joly, JP
Rolland, G
Pichaud, B
Citation: D. Barge et al., Si (001) surface defects after extended high temperature annealing, MAT SCI E B, 71, 2000, pp. 276-281
Authors:
Desplats, R
Rolland, G
Perdu, P
Citation: R. Desplats et al., Faster fault isolation using a dichotomy reduction of node candidates, MICROEL REL, 40(8-10), 2000, pp. 1419-1424
Authors:
Sabatini, M
Rolland, G
Leonce, S
Thomas, M
Lesur, C
Perez, V
de Nanteuil, G
Bonnet, J
Citation: M. Sabatini et al., Effects of ceramide on apoptosis, proteoglycan degradation, and matrix metalloproteinase expression in rabbit articular cartilage, BIOC BIOP R, 267(1), 2000, pp. 438-444
Authors:
Gilet, P
Chenevas-Paule, A
Duvaut, P
Grenouillet, L
Holliger, P
Million, A
Rolland, G
Vannuffel, C
Citation: P. Gilet et al., Growth and characterization of thick GaAsN epilayers and GaInNAs/GaAs multiquantum wells, PHYS ST S-A, 176(1), 1999, pp. 279-283
Authors:
Benbrik, J
Rolland, G
Meunier, D
Benteo, B
Labat, N
Maneux, C
Danto, Y
Citation: J. Benbrik et al., 2D physical simulation of degradation on transistors induced by FIB exposure of dielectric passivation, MICROEL REL, 39(6-7), 1999, pp. 1027-1031
Authors:
Mechin, L
Chabli, A
Bertin, F
Burdin, M
Rolland, G
Vannuffel, C
Villegier, JC
Citation: L. Mechin et al., A combined x-ray specular reflectivity and spectroscopic ellipsometry study of CeO2/yttria-stabilized-zirconia bilayers on Si(100) substrates, J APPL PHYS, 84(9), 1998, pp. 4935-4940
Risultati:
1-9
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