Authors:
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Ronning, C
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Citation: Rf. Davis et al., Conventional and pendeo-epitaxial growth of GaN(0001) thin films on Si(111) substrates, J CRYST GR, 231(3), 2001, pp. 335-341
Authors:
Habenicht, S
Lieb, KP
Bolse, W
Geyer, U
Roccaforte, F
Ronning, C
Citation: S. Habenicht et al., Ion beam erosion of graphite surfaces studied by STM: Ripples, self-affineroughening and near-surface damage accumulation, NUCL INST B, 161, 2000, pp. 958-962
Authors:
Reinke, P
Oelhafen, P
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Citation: P. Reinke et al., Hydrogen-plasma etching of ion beam deposited c-BN films: An in situ investigation of the surface with electron spectroscopy, J APPL PHYS, 88(10), 2000, pp. 5597-5604
Authors:
Ronning, C
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Restle, M
Vetter, U
Ziegeler, L
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Gehrke, T
Jarrendahl, K
Davis, RF
Citation: C. Ronning et al., Ion implanted dopants in GaN and AlN: Lattice sites, annealing behavior, and defect recovery, J APPL PHYS, 87(5), 2000, pp. 2149-2157
Authors:
Waiblinger, R
Sommerhalter, C
Pietzak, B
Krauser, J
Mertesacker, B
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Klaumunzer, S
Weidinger, A
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Hofsass, H
Citation: R. Waiblinger et al., Electrically conducting ion tracks in diamond-like carbon films for field emission, APPL PHYS A, 69(2), 1999, pp. 239-240
Citation: C. Ronning et H. Hofsass, Ion implantation and annealing of diamond studied by emission channeling and cathodoluminescence, DIAM RELAT, 8(8-9), 1999, pp. 1623-1630
Authors:
Dalmer, M
Vetter, U
Restle, M
Stotzler, A
Hofsass, H
Ronning, C
Moodley, MK
Bharuth-Ram, K
Citation: M. Dalmer et al., Combination of emission channeling, photoluminescence and Mossbauer spectroscopy to identify rare earth defect complexes in semiconductors, HYPER INTER, 121(1-8), 1999, pp. 347-352
Authors:
King, SW
Davis, RF
Ronning, C
Benjamin, MC
Nemanich, RJ
Citation: Sw. King et al., Valence band discontinuity, surface reconstruction, and chemistry of (0001), (000(1)over-bar), and (1(1)over-bar-00) 2H-AlN/6H-SiC interfaces, J APPL PHYS, 86(8), 1999, pp. 4483-4490
Authors:
Ronning, C
Banks, AD
McCarson, BL
Schlesser, R
Sitar, Z
Davis, RF
Ward, BL
Nemanich, RJ
Citation: C. Ronning et al., Structural and electronic properties of boron nitride thin films containing silicon, J APPL PHYS, 84(9), 1998, pp. 5046-5051