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Results:
1-9
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Results: 9
Authors:
LUOSTARINEN J
SAVOLAINEN M
PEIPONEN KE
SAVANDER P
Citation: J. Luostarinen et al., MICROLENS ARRAY IN OPTICAL INSPECTION OF CRITICAL SURFACE-ROUGHNESS OF COLD-ROLLED STEEL, Optics and lasers in engineering, 27(4), 1997, pp. 429-433
Authors:
SAVOLAINEN M
PEIPONEN KE
SAVANDER P
SILVENNOINEN R
VEHVILAINEN H
Citation: M. Savolainen et al., NOVEL OPTICAL TECHNIQUES FOR WINDOW GLASS INSPECTION, Measurement science & technology, 6(7), 1995, pp. 1016-1021
Authors:
PEIPONEN KE
SAVANDER P
IKONEN K
SILVENNOINEN R
ASAKURA T
LUUKKO A
Citation: Ke. Peiponen et al., MICROLENS ARRAY IN SURFACE CONTOURING, Optics and lasers in engineering, 22(2), 1995, pp. 149-152
Authors:
PEIPONEN KE
SILVENNOINEN R
SAVANDER P
ASAKURA T
Citation: Ke. Peiponen et al., MICROLENS ARRAY IN SURFACE CURVATURE INSPECTION OF COLD-ROLLED ALUMINUM, Optics and lasers in engineering, 21(3), 1994, pp. 181-184
Authors:
SAVANDER P
Citation: P. Savander, MICROLENS ARRAYS ETCHED INTO GLASS AND SILICON, Optics and lasers in engineering, 20(2), 1994, pp. 97-107
Authors:
SAVANDER P
HAUMANN HJ
Citation: P. Savander et Hj. Haumann, MICROLENS ARRAY USED FOR COLLIMATION OF LINEAR LASER-DIODE ARRAY, Measurement science & technology, 4(4), 1993, pp. 541-543
Authors:
SALMINEN O
SORMUNEN K
KEINONEN T
SAVANDER P
Citation: O. Salminen et al., OPTIMIZATION OF MAXIMUM DIFFRACTION EFFICIENCY OF PHOTORESIST GRATINGS, Optik, 95(2), 1993, pp. 49-52
Authors:
SAVANDER P
SHERIDAN JT
Citation: P. Savander et Jt. Sheridan, DIFFRACTION BY CROSSED GRATING IN PREEXPOSED PHOTORESIST, Optik, 94(3), 1993, pp. 101-113
Authors:
SAVANDER P
SHERIDAN JT
Citation: P. Savander et Jt. Sheridan, PREEXPOSURE FOR 2D GRATINGS IN PHOTORESIST, Optik, 93(2), 1993, pp. 77-83
Risultati:
1-9
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