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Results: 1-7 |
Results: 7
INTERFERENCE EFFECTS IN INELASTIC THICKNESS FRINGES
Authors: NELHIEBEL M SCHENNER M SCHATTSCHNEIDER P
Citation: M. Nelhiebel et al., INTERFERENCE EFFECTS IN INELASTIC THICKNESS FRINGES, Ultramicroscopy, 66(3-4), 1996, pp. 173-181
INCOMPLETE READOUT OF THE GATAN-666 PEELS SPECTROMETER
Authors: NELHIEBEL M SCHENNER M SCHATTSCHNEIDER P
Citation: M. Nelhiebel et al., INCOMPLETE READOUT OF THE GATAN-666 PEELS SPECTROMETER, Ultramicroscopy, 65(3-4), 1996, pp. 199-203
DIFFRACTION EFFECTS IN ELECTRON SPECTROSCOPIC IMAGING
Authors: SCHENNER M NELHIEBEL M SCHATTSCHNEIDER P
Citation: M. Schenner et al., DIFFRACTION EFFECTS IN ELECTRON SPECTROSCOPIC IMAGING, Ultramicroscopy, 65(1-2), 1996, pp. 95-99
DIFFRACTION EFFECTS IN INNER-SHELL IONIZATION EDGES
Authors: SCHATTSCHNEIDER P NELHIEBEL M SCHENNER M GROGGER W HOFER F
Citation: P. Schattschneider et al., DIFFRACTION EFFECTS IN INNER-SHELL IONIZATION EDGES, Journal of Microscopy, 183, 1996, pp. 18-26
VALIDITY OF LORENTZIAN ANGULAR-DISTRIBUTION IN IMAGE-FORMATION WITH INELASTICALLY SCATTERED ELECTRONS
Authors: SCHENNER M SCHATTSCHNEIDER P EGERTON RF
Citation: M. Schenner et al., VALIDITY OF LORENTZIAN ANGULAR-DISTRIBUTION IN IMAGE-FORMATION WITH INELASTICALLY SCATTERED ELECTRONS, Micron, 26(5), 1995, pp. 391-394
SPATIALLY-RESOLVED MICROANALYSIS OF THIN-FILMS IN THE TRANSMISSION ELECTRON-MICROSCOPE
Authors: SCHENNER M SCHATTSCHNEIDER P SU DS ZEITLER E
Citation: M. Schenner et al., SPATIALLY-RESOLVED MICROANALYSIS OF THIN-FILMS IN THE TRANSMISSION ELECTRON-MICROSCOPE, Vacuum, 46(8-10), 1995, pp. 1041-1042
SPATIAL-RESOLUTION IN SELECTED-AREA EELS
Authors: SCHENNER M SCHATTSCHNEIDER P
Citation: M. Schenner et P. Schattschneider, SPATIAL-RESOLUTION IN SELECTED-AREA EELS, Ultramicroscopy, 55(1), 1994, pp. 31-41
Risultati: 1-7 |