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Results: 1-9 |
Results: 9
ELECTRON-ENERGY-LOSS SPECTROSCOPY STUDIES OF CU-ALPHA-AL2O3 INTERFACES GROWN BY MOLECULAR-BEAM EPITAXY
Authors: SCHEU C DEHM G RUHLE M
Citation: C. Scheu et al., ELECTRON-ENERGY-LOSS SPECTROSCOPY STUDIES OF CU-ALPHA-AL2O3 INTERFACES GROWN BY MOLECULAR-BEAM EPITAXY, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 78(2), 1998, pp. 439-465
GROWTH AND STRUCTURE OF INTERNAL CU AL2O3 AND CU/TI/AL2O3 INTERFACES/
Authors: DEHM G SCHEU C RUHLE M RAJ R
Citation: G. Dehm et al., GROWTH AND STRUCTURE OF INTERNAL CU AL2O3 AND CU/TI/AL2O3 INTERFACES/, Acta materialia, 46(3), 1998, pp. 759-772
MICROSTRUCTURE AND PHASE EVOLUTION OF NIOBIUM-ALUMINIDE-ALUMINA COMPOSITES PREPARED BY MELT-INFILTRATION
Authors: SCHEU C DEHM G KAPLAN WD WAGNER F CLAUSSEN N
Citation: C. Scheu et al., MICROSTRUCTURE AND PHASE EVOLUTION OF NIOBIUM-ALUMINIDE-ALUMINA COMPOSITES PREPARED BY MELT-INFILTRATION, Physica status solidi. a, Applied research, 166(1), 1998, pp. 241-255
ELECTRON-ENERGY-LOSS NEAR-EDGE STRUCTURE OF ALUMINA POLYMORPHS
Authors: LEVIN I BERNER A SCHEU C MUELLEJANS H BRANDON DG
Citation: I. Levin et al., ELECTRON-ENERGY-LOSS NEAR-EDGE STRUCTURE OF ALUMINA POLYMORPHS, Mikrochimica acta (1966), 1998, pp. 93-96
THE REACTION BETWEEN A TINI SHAPE-MEMORY THIN-FILM AND SILICON
Authors: STEMMER S DUSCHER G SCHEU C HEUER AH RUHLE M
Citation: S. Stemmer et al., THE REACTION BETWEEN A TINI SHAPE-MEMORY THIN-FILM AND SILICON, Journal of materials research, 12(7), 1997, pp. 1734-1740
SYNTHESIS OF ANALYTICAL AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY TO DETERMINE THE INTERFACE STRUCTURE OF CU AL2O3/
Authors: DEHM G SCHEU C MOBUS G BRYDSON R RUHLE M
Citation: G. Dehm et al., SYNTHESIS OF ANALYTICAL AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY TO DETERMINE THE INTERFACE STRUCTURE OF CU AL2O3/, Ultramicroscopy, 67(1-4), 1997, pp. 207-217
TRANSMISSION ELECTRON-MICROSCOPY AT THE MAX-PLANCK-INSTITUT FUR METALLFORSCHUNG
Authors: DEHM G ERNST F MAYER J MOBUS G MULLEJANS H PHILLIPP F SCHEU C RUHLE M
Citation: G. Dehm et al., TRANSMISSION ELECTRON-MICROSCOPY AT THE MAX-PLANCK-INSTITUT FUR METALLFORSCHUNG, Zeitschrift fur Metallkunde, 87(11), 1996, pp. 898-910
ELECTRON-ENERGY-LOSS NEAR-EDGE STRUCTURE OF METAL-ALUMINA INTERFACES
Authors: SCHEU C DEHM G MULLEJANS H BRYDSON R RUHLE M
Citation: C. Scheu et al., ELECTRON-ENERGY-LOSS NEAR-EDGE STRUCTURE OF METAL-ALUMINA INTERFACES, Microscopy microanalysis microstructures, 6(1), 1995, pp. 19-31
MODELING THE BONDING AT METAL-CERAMIC INTERFACES USING PEELS IN THE STEM
Authors: BRYDSON R BRULEY J MULLEJANS H SCHEU C RUHLE M
Citation: R. Brydson et al., MODELING THE BONDING AT METAL-CERAMIC INTERFACES USING PEELS IN THE STEM, Ultramicroscopy, 59(1-4), 1995, pp. 81-92
Risultati: 1-9 |