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Results:
1-7
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Results: 7
Authors:
VANMEER H
VALENZA M
VANDERZANDEN K
DERAEDT W
SIMOEN E
SCHREURS D
KAUFMANN L
Citation: H. Vanmeer et al., EFFECT OF SCHOTTKY-BARRIER ALTERATION ON THE LOW-FREQUENCY NOISE OF INP-BASED HEMTS, IEEE electron device letters, 19(10), 1998, pp. 370-372
Authors:
WAN CH
NAUWELAERS B
SCHREURS D
DERAEDT W
VANROSSUM M
Citation: Ch. Wan et al., A NEW TECHNIQUE FOR IN-FIXTURE CALIBRATION USING STANDARDS OF CONSTANT LENGTH, IEEE transactions on microwave theory and techniques, 46(9), 1998, pp. 1318-1320
Authors:
SCHREURS D
VANMEER H
VANDERZANDEN K
DERAEDT W
NAUWELAERS B
VANDECAPELLE A
Citation: D. Schreurs et al., IMPROVED HEMT MODEL FOR LOW PHASE-NOISE INP-BASED MMIC OSCILLATORS, IEEE transactions on microwave theory and techniques, 46(10), 1998, pp. 1583-1585
Authors:
VANHOVE M
FINDERS J
VANDERZANDEN K
DERAEDT W
VANROSSUM M
BAEYENS Y
SCHREURS D
MENOZZI R
Citation: M. Vanhove et al., MATERIAL AND PROCESS-RELATED LIMITATIONS OF INP HEMT PERFORMANCE, Materials science & engineering. B, Solid-state materials for advanced technology, 44(1-3), 1997, pp. 311-315
Authors:
ABOUKHALIL M
SCHREURS D
NAUWELAERS B
VANROSSUM M
MACIEJKO R
WU K
Citation: M. Aboukhalil et al., EFFECT OF CAPTURE AND ESCAPE PHENOMENA IN MONTE-CARLO TECHNIQUE ON THE SIMULATION OF THE NONLINEAR CHARACTERISTICS IN HIGH-ELECTRON-MOBILITY TRANSISTORS, Journal of applied physics, 82(12), 1997, pp. 6312-6318
Authors:
SCHREURS D
SPIERS A
DERAEDT W
VANDERZANDEN K
BAEYENS Y
VANHOVE M
NAUWELAERS B
VANROSSUM M
Citation: D. Schreurs et al., DC, LF DISPERSION AND HF CHARACTERIZATION OF SHORT-TIME STRESSED INP BASED LM-HEMTS, Microelectronics and reliability, 36(11-12), 1996, pp. 1911-1914
Authors:
JANSEN P
SCHREURS D
DERAEDT W
NAUWELAERS B
VANROSSUM M
Citation: P. Jansen et al., CONSISTENT SMALL-SIGNAL AND LARGE-SIGNAL EXTRACTION TECHNIQUES FOR HETEROJUNCTION FETS, IEEE transactions on microwave theory and techniques, 43(1), 1995, pp. 87-93
Risultati:
1-7
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