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TANG SP
WALLACE RM
SEABAUGH A
KINGSMITH D
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Authors:
SKALA SL
WU W
TUCKER JR
LYDING JW
SEABAUGH A
BEAM EA
JOVANOVIC D
Citation: Sl. Skala et al., INTERFACE CHARACTERIZATION IN AN INP INGAAS RESONANT-TUNNELING DIODE BY SCANNING-TUNNELING-MICROSCOPY/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(2), 1995, pp. 660-663
Authors:
WU W
SKALA SL
TUCKER JR
LYDING JW
SEABAUGH A
BEAM EA
JOVANOVIC D
Citation: W. Wu et al., INTERFACE CHARACTERIZATION OF AN INP INGAAS RESONANT-TUNNELING DIODE BY SCANNING-TUNNELING-MICROSCOPY/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 602-606