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Results: 1-11 |
Results: 11
THE USE OF SIMULTANEOUS FLUORESCENCE AND DIFFERENTIAL PHASE CONFOCAL MICROSCOPY TO STUDY ALAMAR BLUE(TM) REDUCTION IN AN EPITHELIAL-CELL LINE
Authors: GARSIDE JR CLOTHIER RH SOMEKH MG SEE CW
Citation: Jr. Garside et al., THE USE OF SIMULTANEOUS FLUORESCENCE AND DIFFERENTIAL PHASE CONFOCAL MICROSCOPY TO STUDY ALAMAR BLUE(TM) REDUCTION IN AN EPITHELIAL-CELL LINE, ATLA. Alternatives to laboratory animals, 26(4), 1998, pp. 505-522
ULTRASTABLE ABSOLUTE-PHASE COMMON-PATH OPTICAL PROFILER BASED ON COMPUTER-GENERATED HOLOGRAPHY
Authors: SAWYER NBE SEE CW CLARK M SOMEKH MG GOH JYL
Citation: Nbe. Sawyer et al., ULTRASTABLE ABSOLUTE-PHASE COMMON-PATH OPTICAL PROFILER BASED ON COMPUTER-GENERATED HOLOGRAPHY, Applied optics, 37(28), 1998, pp. 6716-6720
BIOLOGICAL IMAGING USING FAST LASER-SCANNING HETERODYNE DIFFERENTIAL PHASE CONFOCAL MICROSCOPES
Authors: GARSIDE JR SOMEKH MG SEE CW
Citation: Jr. Garside et al., BIOLOGICAL IMAGING USING FAST LASER-SCANNING HETERODYNE DIFFERENTIAL PHASE CONFOCAL MICROSCOPES, Journal of Microscopy, 185, 1997, pp. 385-395
SINGLE-PROBE-BEAM DIFFERENTIAL AMPLITUDE AND PHASE-SCANNING INTERFEROMETER
Authors: SUDDENDORF MB SOMEKH MG SEE CW
Citation: Mb. Suddendorf et al., SINGLE-PROBE-BEAM DIFFERENTIAL AMPLITUDE AND PHASE-SCANNING INTERFEROMETER, Applied optics, 36(25), 1997, pp. 6202-6210
A FAST-SCANNING OPTICAL MICROSCOPE FOR IMAGING MAGNETIC DOMAIN-STRUCTURES
Authors: PING GL SEE CW SOMEKH MG SUDDENDORF MB VINCENT JH FOOTNER PK
Citation: Gl. Ping et al., A FAST-SCANNING OPTICAL MICROSCOPE FOR IMAGING MAGNETIC DOMAIN-STRUCTURES, Scanning, 18(1), 1996, pp. 8-12
A CONFOCAL FIBER SCANNING MICROSCOPE FOR MAGNETIC DOMAIN IMAGING
Authors: PING GL SEE CW SOMEKH MG
Citation: Gl. Ping et al., A CONFOCAL FIBER SCANNING MICROSCOPE FOR MAGNETIC DOMAIN IMAGING, Journal of Microscopy, 184, 1996, pp. 149-156
SCANNING OPTICAL MICROELLIPSOMETER FOR PURE SURFACE PROFILING
Authors: SEE CW SOMEKH MG HOLMES RD
Citation: Cw. See et al., SCANNING OPTICAL MICROELLIPSOMETER FOR PURE SURFACE PROFILING, Applied optics, 35(34), 1996, pp. 6663-6668
AN ACCURATE NONCONTACTING LASER-BASED SYSTEM FOR SURFACE-WAVE VELOCITY-MEASUREMENT
Authors: SOMEKH MG LIU M HO HP SEE CW
Citation: Mg. Somekh et al., AN ACCURATE NONCONTACTING LASER-BASED SYSTEM FOR SURFACE-WAVE VELOCITY-MEASUREMENT, Measurement science & technology, 6(9), 1995, pp. 1329-1337
SCANNING MICROELLIPSOMETRY FOR EXTRACTION OF TRUE TOPOGRAPHY
Authors: HOLMES RD SEE CW SOMEKH MG
Citation: Rd. Holmes et al., SCANNING MICROELLIPSOMETRY FOR EXTRACTION OF TRUE TOPOGRAPHY, Electronics Letters, 31(5), 1995, pp. 358-359
COMBINED DIFFERENTIAL AMPLITUDE AND PHASE INTERFEROMETER WITH A SINGLE PROBE BEAM
Authors: SUDDENDORF MB SEE CW SOMEKH MG
Citation: Mb. Suddendorf et al., COMBINED DIFFERENTIAL AMPLITUDE AND PHASE INTERFEROMETER WITH A SINGLE PROBE BEAM, Applied physics letters, 67(1), 1995, pp. 28-30
DIRECT AND INDIRECT DUAL-PROBE INTERFEROMETERS FOR ACCURATE SURFACE-WAVE MEASUREMENTS
Authors: HO HP SOMEKH MG LIU M SEE CW
Citation: Hp. Ho et al., DIRECT AND INDIRECT DUAL-PROBE INTERFEROMETERS FOR ACCURATE SURFACE-WAVE MEASUREMENTS, Measurement science & technology, 5(12), 1994, pp. 1480-1490
Risultati: 1-11 |