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Results:
1-8
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Results: 8
Authors:
BARD M
COUDERC LJ
SAIMOT AG
SCHERRER A
FRACHON I
SEIGNEUR F
CAUBARRERE I
Citation: M. Bard et al., ACCELERATED OBSTRUCTIVE PULMONARY-DISEASE IN HIV-INFECTED PATIENTS WITH BRONCHIECTASIS, The European respiratory journal, 11(3), 1998, pp. 771-775
Authors:
SEIGNEUR F
AUTRAN JL
PLOSSU C
BALLAND B
BADOT D
STRABONI A
Citation: F. Seigneur et al., EFFECT OF (CO)-C-60 IRRADIATION AND FOWLER-NORDHEIM INJECTION ON MOS CAPACITORS WITH THIN PLASMA-NITRIDED GATE OXIDES, Microelectronic engineering, 28(1-4), 1995, pp. 345-348
Authors:
AUTRAN JL
PLOSSU C
SEIGNEUR F
BALLAND B
STRABONI A
Citation: Jl. Autran et al., A COMPARISON OF SI-SIO2 INTERFACE-TRAP PROPERTIES IN THIN-FILM TRANSISTORS WITH THERMAL AND PLASMA-NITRIDED OXIDES, Journal of non-crystalline solids, 187, 1995, pp. 374-379
Authors:
RAYNAUD C
AUTRQAN JL
SEIGNEUR F
JAUSSAUD C
BILLON T
GUILLOT G
BALLAND B
Citation: C. Raynaud et al., INSTABILITIES IN 6H-SIC MOS STRUCTURES, Journal de physique. III, 4(5), 1994, pp. 937-952
Authors:
STERN M
JOINTLAMBERT O
HERNIGOU A
TAINTURIER C
SEIGNEUR F
CAUBARRERE I
Citation: M. Stern et al., EVALUATION OF RIGHT-VENTRICULAR FUNCTION FOR LONG TRANSPLANTATION - ROLE OF ELECTRON FLOW SCAN, Journal de radiologie, 75(12), 1994, pp. 687-691
Authors:
KAABI L
GONTRAND C
REMAKI B
SEIGNEUR F
BALLAND B
Citation: L. Kaabi et al., ANALYSIS OF LOW-ENERGY BORON IMPLANTS IN SILICON THROUGH SIO2-FILMS -IMPLANTATION DAMAGE AND ANOMALOUS DIFFUSION, Microelectronics, 25(7), 1994, pp. 567-576
Authors:
AUTRAN JL
SEIGNEUR F
DELMAS J
PLOSSU C
BALLAND B
Citation: Jl. Autran et al., CHARACTERIZATION OF INTERFACE STATES IN S UBMICROMETER MOS-TRANSISTORS BY DIFFERENT CHARGE-PUMPING TECHNIQUES, Journal de physique. III, 3(10), 1993, pp. 1947-1961
Authors:
AUTRAN JL
SEIGNEUR F
PLOSSU C
BALLAND B
Citation: Jl. Autran et al., CHARACTERIZATION OF SI-SIO2 INTERFACE STATES - COMPARISON BETWEEN DIFFERENT CHARGE-PUMPING AND CAPACITANCE TECHNIQUES, Journal of applied physics, 74(6), 1993, pp. 3932-3935
Risultati:
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