Citation: Ez. Kurmaev et al., STUDIES OF SOLID INTERFACES USING SOFT-X-RAY EMISSION-SPECTROSCOPY, Critical reviews in solid state and materials sciences, 23(2), 1998, pp. 65-203
Authors:
KURMAEV EZ
VANEK J
EDERER DL
ZHOU L
CALLCOTT TA
PERERA RCC
CHERKASHENKO VM
SHAMIN SN
TROFIMOVA VA
BARTKOWSKI S
NEUMANN M
FUJIMORI A
MOLOSHAG VP
Citation: Ez. Kurmaev et al., EXPERIMENTAL AND THEORETICAL INVESTIGATION OF THE ELECTRONIC-STRUCTURE OF TRANSITION-METAL SULFIDES - CUS, FES2 AND FECUS2, Journal of physics. Condensed matter, 10(7), 1998, pp. 1687-1697
Authors:
KURMAEV EZ
GALAKHOV VR
SHAMIN SN
RODRIGUEZ T
ALMENDRA A
SANZMAUDES J
GORANSSON K
ENGSTROM I
Citation: Ez. Kurmaev et al., SOLID-PHASE REACTIONS IN IR (111)SI SYSTEMS STUDIED BY MEANS OF X-RAY-EMISSION SPECTROSCOPY/, Journal of materials research, 13(7), 1998, pp. 1950-1955
Authors:
KURMAEV EZ
BARTKOWSKI S
NEUMANN M
STADLER S
EDERER DL
GALAKHOV VR
YARMOSHENKO YM
SOLOVYEV IV
SHAMIN SN
TROFIMOVA VA
ZATSEPIN DA
Citation: Ez. Kurmaev et al., ELECTRONIC-STRUCTURE OF TERNARY TRANSITION-METAL OXIDES AND SULFIDES - X-RAY PHOTOELECTRON AND X-RAY-EMISSION SPECTROSCOPY STUDY, Journal of electron spectroscopy and related phenomena, 88, 1998, pp. 441-447
Authors:
KUROSAWA K
HERMAN PR
KURMAEV EZ
SHAMIN SN
GALAKHOV VR
TAKIGAWA Y
YOKOTANI A
KAMEYAMA A
SASAKI W
Citation: K. Kurosawa et al., X-RAY-EMISSION SPECTROSCOPIC STUDIES OF SILICON PRECIPITATION IN SURFACE-LAYER OF SIO2 INDUCED BY ARGON EXCIMER-LASER IRRADIATION, Applied surface science, 126(1-2), 1998, pp. 83-91
Authors:
WINARSKI RP
EDERER DL
PIVIN JC
KURMAEV EZ
SHAMIN SN
MOEWES A
CHANG GS
WHANG CN
ENDO K
IDA T
Citation: Rp. Winarski et al., SOFT-X-RAY FLUORESCENCE MEASUREMENTS OF IRRADIATED POLYMER-FILMS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 145(3), 1998, pp. 401-408
Authors:
KURMAEV EZ
EZHOV AV
CHERKASHENKO VM
SHAMIN SN
BARTKOWSKI S
NEUMANN M
GANGOPADHYAY AK
Citation: Ez. Kurmaev et al., ELECTRONIC-STRUCTURE OF YNI1-XCUXBC STUDIED BY X-RAY-EMISSION AND PHOTOELECTRON-SPECTROSCOPY, Solid state communications, 105(1), 1998, pp. 65-70
Authors:
KURMAEV EZ
SHAMIN SN
GALAKHOV VR
MAKHNEV AA
KIRILLOVA MM
KURENNYKH TE
VYKHODETS VB
KASCHIEVA S
Citation: Ez. Kurmaev et al., THE INFLUENCE OF HIGH-ENERGY ELECTRON-IRRADIATION AND BORON IMPLANTATION ON THE OXIDE THICKNESS IN THE SIO2 SI SYSTEM/, Journal of physics. Condensed matter, 9(32), 1997, pp. 6969-6978
Authors:
KURMAEV EZ
SHAMIN SN
GALAKHOV VR
SOKOLOV VI
LUDWIG MH
HUMMEL RE
Citation: Ez. Kurmaev et al., X-RAY-EMISSION SPECTRA AND THE EFFECT OF OXIDATION ON THE LOCAL-STRUCTURE OF POROUS AND SPARK-PROCESSED SILICON, Journal of physics. Condensed matter, 9(12), 1997, pp. 2671-2681
Authors:
KURMAEV EZ
GALAKHOV VR
SHAMIN SN
SOKOLOV VI
HUMMEL RE
LUDWIG MH
Citation: Ez. Kurmaev et al., LOCAL-STRUCTURE OF POROUS SILICON STUDIED BY MEANS OF X-RAY-EMISSION SPECTROSCOPY, Applied physics A: Materials science & processing, 65(2), 1997, pp. 183-189
Authors:
KURMAEV EZ
EZHOV AV
SHAMIN SN
CHERKASHENKO VM
ANDREEV YG
LUNDSTROM T
Citation: Ez. Kurmaev et al., X-RAY-EMISSION SPECTRA AND STRUCTURAL MODELS OF BCN MATERIALS, Journal of alloys and compounds, 248(1-2), 1997, pp. 86-89
Citation: Ez. Kurmaev et al., APPLICATION OF HIGH-ENERGY RESOLVED X-RAY-EMISSION SPECTROSCOPY FOR MONITORING OF SILICIDE FORMATION IN CO SIO2/SI SYSTEM/, Thin solid films, 311(1-2), 1997, pp. 28-32
Authors:
LU ZW
KLEIN BM
KURMAEV EZ
CHERKASHENKO VM
GALAKHOV VR
SHAMIN SN
YARMOSHENKO YM
TROFIMOVA VA
UHLENBROCK S
NEUMANN M
FURUBAYASHI T
HAGINO T
NAGATA S
Citation: Zw. Lu et al., ELECTRONIC-STRUCTURE OF CUV2S4, Physical review. B, Condensed matter, 53(15), 1996, pp. 9626-9633
Authors:
KURMAEV EZ
SHAMIN SN
GALAKHOV VR
WIECH G
MAJKOVA E
LUBY S
Citation: Ez. Kurmaev et al., CHARACTERIZATION OF W SI MULTILAYERS BY ULTRASOFT X-RAY-EMISSION SPECTROSCOPY/, Journal of materials research, 10(4), 1995, pp. 907-911
Authors:
KURMAEV EZ
SHAMIN SN
DOLGIH VE
KUROSAWA K
NAKAMAE K
TAKIGAWA Y
KAMEYAMA A
YOKOTANI A
SASAKI W
Citation: Ez. Kurmaev et al., ULTRASOFT X-RAY-EMISSION SPECTROSCOPIC ANALYSIS FOR EFFECTS OF VACUUM-ULTRAVIOLET RARE-GAS EXCIMER-LASER IRRADIATION ON SILICON-NITRIDE FILMS, JPN J A P 2, 33(11A), 1994, pp. 120001549-120001551
Authors:
YARMOSHENKO YM
TROFIMOVA VA
SHAMIN SN
SOLOVYEV IV
KURMAEV EZ
ETTEMA ARHF
HAAS C
Citation: Ym. Yarmoshenko et al., THE X-RAY-EMISSION SPECTRA AND ELECTRONIC-STRUCTURE OF THE MISFIT LAYER COMPOUNDS (BIS)1.08NBS2 AND (PBS)1.14TAS2, Journal of physics. Condensed matter, 6(21), 1994, pp. 3993-3998
Citation: Ez. Kurmaev et al., BORATE SUBSTITUTION IN YSRBACU3O7 STUDIED BY X-RAY-EMISSION SPECTROSCOPY, Physica. C, Superconductivity, 227(3-4), 1994, pp. 309-312
Authors:
POSTNIKOV AV
BARTKOWSKI S
NEUMANN M
RUPP RA
KURMAEV EZ
SHAMIN SN
FEDORENKO VV
Citation: Av. Postnikov et al., ELECTRONIC-STRUCTURE AND VALENCE-BAND SPECTRA OF FEBO3, Physical review. B, Condensed matter, 50(20), 1994, pp. 14849-14854
Authors:
GALAKHOV VR
KURMAEV EZ
SHAMIN SN
ELOKHINA LV
YARMOSHENKO YM
BUKHARAEV AA
Citation: Vr. Galakhov et al., ANALYSIS OF THE DEPTH PROFILE OF FE-SI BURIED LAYERS IN FE-IMPLANTED SI WAFER BY SOFT-X-RAY EMISSION-SPECTROSCOPY(), Applied surface science, 72(1), 1993, pp. 73-77
Citation: Sn. Shamin et al., CHARACTERIZATION OF DIAMOND-LIKE FILMS BY X-RAY-EMISSION SPECTROSCOPYWITH HIGH-ENERGY RESOLUTION, Journal of applied physics, 73(9), 1993, pp. 4605-4609