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Results: 1-12 |
Results: 12
INFLUENCE OF PULSED-LASER RADIATION ON THE REAL STRUCTURE OF CDTE SINGLE-CRYSTALS
Authors: SHULPINA IL ZELENINA NK MATVEEV OA
Citation: Il. Shulpina et al., INFLUENCE OF PULSED-LASER RADIATION ON THE REAL STRUCTURE OF CDTE SINGLE-CRYSTALS, Physics of the solid state, 40(1), 1998, pp. 59-62
EVOLUTION OF DOMAINS AND THERMAL HYSTERESIS EFFECTS IN THE PYROCHLORE-STRUCTURE FERROELECTRIC CD2NB2O7
Authors: KOLPAKOVA NN SHULPINA IL SHCHEPANSKA L PISKUNOVICH P
Citation: Nn. Kolpakova et al., EVOLUTION OF DOMAINS AND THERMAL HYSTERESIS EFFECTS IN THE PYROCHLORE-STRUCTURE FERROELECTRIC CD2NB2O7, Technical physics letters, 23(12), 1997, pp. 972-974
X-RAY TOPOGRAPHY OF COMPLICATED CROSS-SECTION SAPPHIRE SHAPED CRYSTALS
Authors: SHULPINA IL ANTONOV PI BAKHOLDIN SI KRYMOV VM
Citation: Il. Shulpina et al., X-RAY TOPOGRAPHY OF COMPLICATED CROSS-SECTION SAPPHIRE SHAPED CRYSTALS, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 219-225
SUPERSTRUCTURE AND THERMAL HYSTERESIS EFFECTS AT T-CURIE IN CD2NB2O7 PYROCHLORE
Authors: KOLPAKOVA NN SZCZEPANSKA L SHULPINA IL WIESNER M PISKUNOWICZ P
Citation: Nn. Kolpakova et al., SUPERSTRUCTURE AND THERMAL HYSTERESIS EFFECTS AT T-CURIE IN CD2NB2O7 PYROCHLORE, Ferroelectrics, 190(1-4), 1997, pp. 173-178
DETECTION AND ANALYSIS OF DEFECTS IN MONO CRYSTALS AND EPITAXIAL LAYERS BASED ON CDTE BY THE X-RAY TOPOGRAPHY METHODS
Authors: SHULPINA IL ARGUNOVA TS RATNIKOV VV
Citation: Il. Shulpina et al., DETECTION AND ANALYSIS OF DEFECTS IN MONO CRYSTALS AND EPITAXIAL LAYERS BASED ON CDTE BY THE X-RAY TOPOGRAPHY METHODS, Zurnal tehniceskoj fiziki, 65(4), 1995, pp. 180-188
DETECTION OF DISLOCATIONS IN STRONGLY ABSORBING CRYSTALS BY PROJECTION X-RAY TOPOGRAPHY IN BACK REFLECTION
Authors: SHULPINA IL ARGUNOVA TS
Citation: Il. Shulpina et Ts. Argunova, DETECTION OF DISLOCATIONS IN STRONGLY ABSORBING CRYSTALS BY PROJECTION X-RAY TOPOGRAPHY IN BACK REFLECTION, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 47-49
FORMATION OF A REAL STRUCTURE OF COMPLEX SHAPE SAPPHIRE CRYSTALS AT THE INITIAL PART OF A GROWTH PERIOD
Authors: ANTONOV PI SHULPINA IL BAKHOLDIN SI VLASOV VP TCHEGLOV MP
Citation: Pi. Antonov et al., FORMATION OF A REAL STRUCTURE OF COMPLEX SHAPE SAPPHIRE CRYSTALS AT THE INITIAL PART OF A GROWTH PERIOD, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 58(9), 1994, pp. 42-51
DISLOCATION NUCLEATION AND MOTION UNDER M ECHANICAL SURFACE DAMAGE OFSILICON-CARBIDE
Authors: TREGUBOVA AS MOKHOV EN SHULPINA IL
Citation: As. Tregubova et al., DISLOCATION NUCLEATION AND MOTION UNDER M ECHANICAL SURFACE DAMAGE OFSILICON-CARBIDE, Fizika tverdogo tela, 36(1), 1994, pp. 132-136
DEFECT CONTRAST IN PROJECTION TOPOGRAPHY OF STRONGLY ABSORBING CRYSTALS
Authors: SHULPINA IL
Citation: Il. Shulpina, DEFECT CONTRAST IN PROJECTION TOPOGRAPHY OF STRONGLY ABSORBING CRYSTALS, Kristallografia, 39(2), 1994, pp. 270-277
DEFECTS IN SILICON EPITAXIAL COMPOSITIONS
Authors: GITOVICH EA GUSEVA NB KUZNETSOV VA TSABOLOVA MY SHULPINA IL
Citation: Ea. Gitovich et al., DEFECTS IN SILICON EPITAXIAL COMPOSITIONS, Fizika tverdogo tela, 35(6), 1993, pp. 1508-1513
X-RAY STUDY OF DISLOCATION-STRUCTURE FORMATION FEATURES IN EPITAXIAL SYSTEMS WITH SMALL MISMATCH
Authors: PROKHOROV IA ZAKHAROV BG MANSHIN VS SHULPINA IL
Citation: Ia. Prokhorov et al., X-RAY STUDY OF DISLOCATION-STRUCTURE FORMATION FEATURES IN EPITAXIAL SYSTEMS WITH SMALL MISMATCH, Journal of physics. D, Applied physics, 26(4A), 1993, pp. 76-81
MICRODEFECTS INVESTIGATED BY X-RAY TOPOGRAPHY
Authors: SHULPINA IL
Citation: Il. Shulpina, MICRODEFECTS INVESTIGATED BY X-RAY TOPOGRAPHY, Journal of physics. D, Applied physics, 26(4A), 1993, pp. 82-85
Risultati: 1-12 |