ACNP - Italian Periodicals Catalogue

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Results: 1-25 | 26-41

Results: 1-25/41

ASSESSMENT OF SURFACE GEOMETRY USING CONFOCAL SCANNING OPTICAL MICROSCOPE

Authors: UDUPA G SINGAPERUMAL M SIROHI RS KOTHIYAL MP

Citation: G. Udupa et al., ASSESSMENT OF SURFACE GEOMETRY USING CONFOCAL SCANNING OPTICAL MICROSCOPE, Mechatronics, 8(3), 1998, pp. 187-215

A PHASE-CONJUGATE TWYMAN-GREEN INTERFEROMETER WITH INCREASED SENSITIVITY FOR LASER-BEAM COLLIMATION

Authors: DARLIN JS KOTHIYAL MP SIROHI RS

Citation: Js. Darlin et al., A PHASE-CONJUGATE TWYMAN-GREEN INTERFEROMETER WITH INCREASED SENSITIVITY FOR LASER-BEAM COLLIMATION, J. mod. opt. (Print), 45(11), 1998, pp. 2371-2378

SPECKLE PHOTOGRAPHY WITH BATIO3 CRYSTAL FOR THE MEASUREMENT OF INPLANE DISPLACEMENT FIELD DISTRIBUTION OF DISTANT OBJECTS

Authors: MOHAN NK DARLIN JS ARA MHM KOTHIYAL MP SIROHI RS

Citation: Nk. Mohan et al., SPECKLE PHOTOGRAPHY WITH BATIO3 CRYSTAL FOR THE MEASUREMENT OF INPLANE DISPLACEMENT FIELD DISTRIBUTION OF DISTANT OBJECTS, Optics and lasers in engineering, 29(2-3), 1998, pp. 211-216

HYBRID WEDGE PLATE-GRATING INTERFEROMETER FOR COLLIMATION TESTING

Authors: DARLIN JS KOTHIYAL MP SIROHI RS

Citation: Js. Darlin et al., HYBRID WEDGE PLATE-GRATING INTERFEROMETER FOR COLLIMATION TESTING, Optical engineering, 37(5), 1998, pp. 1593-1598

PHASE STEP CALIBRATION AND PHASE MEASUREMENT IN IMAGE PLANE HOLOGRAPHY USING BATIO3 CRYSTAL AS A RECORDING MEDIUM

Authors: HELEN SS ARA MHM DARLIN JS MOHAN NK KOTHIYAL MP SIROHI RS

Citation: Ss. Helen et al., PHASE STEP CALIBRATION AND PHASE MEASUREMENT IN IMAGE PLANE HOLOGRAPHY USING BATIO3 CRYSTAL AS A RECORDING MEDIUM, Optical engineering, 37(11), 1998, pp. 2918-2925

PASSIVE OPTICAL WAVE-GUIDE DEVICES BY ION-EXCHANGE IN GLASS

Authors: SANTHANAKRISHNAN T SREEDHAR PR SIROHI RS

Citation: T. Santhanakrishnan et al., PASSIVE OPTICAL WAVE-GUIDE DEVICES BY ION-EXCHANGE IN GLASS, Optik, 109(1), 1998, pp. 1-4

ACHROMATIC PHASE-SHIFTING BY A ROTATING POLARIZER

Authors: HELEN SS KOTHIYAL MP SIROHI RS

Citation: Ss. Helen et al., ACHROMATIC PHASE-SHIFTING BY A ROTATING POLARIZER, Optics communications, 154(5-6), 1998, pp. 249-254

A NEW OPTICAL CONFIGURATION IN SPECKLE INTERFEROMETRY FOR CONTOURING OF 3-DIMENSIONAL OBJECTS

Authors: SANTHANAKRISHNAN T PALANISAMY PK MOHAN NK SIROHI RS

Citation: T. Santhanakrishnan et al., A NEW OPTICAL CONFIGURATION IN SPECKLE INTERFEROMETRY FOR CONTOURING OF 3-DIMENSIONAL OBJECTS, Optics communications, 152(1-3), 1998, pp. 19-22

WEDGE PLATE INTERFEROMETRY - A NEW DUAL FIELD CONFIGURATION FOR COLLIMATION TESTING

Authors: DARLIN JS KOTHIYAL MP SIROHI RS

Citation: Js. Darlin et al., WEDGE PLATE INTERFEROMETRY - A NEW DUAL FIELD CONFIGURATION FOR COLLIMATION TESTING, Optics and Laser Technology, 30(3-4), 1998, pp. 225-228

FRINGE FORMATION IN AN INPLANE DISPLACEMENT MEASUREMENT CONFIGURATIONWITH TWOFOLD INCREASE IN SENSITIVITY - THEORY AND EXPERIMENT

Authors: SANTHANAKRISHNAN T PALANISAMY PK SIROHI RS

Citation: T. Santhanakrishnan et al., FRINGE FORMATION IN AN INPLANE DISPLACEMENT MEASUREMENT CONFIGURATIONWITH TWOFOLD INCREASE IN SENSITIVITY - THEORY AND EXPERIMENT, Applied optics, 37(19), 1998, pp. 4150-4153

OPTICAL CONFIGURATION IN SPECKLE SHEAR INTERFEROMETRY FOR SLOPE CHANGE CONTOURING WITH A TWOFOLD INCREASE IN SENSITIVITY

Authors: SANTHANAKRISHNAN T PALANISAMY PK SIROHI RS

Citation: T. Santhanakrishnan et al., OPTICAL CONFIGURATION IN SPECKLE SHEAR INTERFEROMETRY FOR SLOPE CHANGE CONTOURING WITH A TWOFOLD INCREASE IN SENSITIVITY, Applied optics, 37(16), 1998, pp. 3447-3449

SELF-REFERENCING CYCLIC SHEARING INTERFEROMETER FOR COLLIMATION TESTING

Authors: DARLIN JS KOTHIYAL MP SIROHI RS

Citation: Js. Darlin et al., SELF-REFERENCING CYCLIC SHEARING INTERFEROMETER FOR COLLIMATION TESTING, J. mod. opt., 44(5), 1997, pp. 929-939

OBLIQUE OBSERVATION SPECKLE SHEAR INTERFEROMETERS FOR SLOPE CHANGE CONTOURING

Authors: SANTHANAKRISHNAN T MOHAN NK SIROHI RS

Citation: T. Santhanakrishnan et al., OBLIQUE OBSERVATION SPECKLE SHEAR INTERFEROMETERS FOR SLOPE CHANGE CONTOURING, J. mod. opt., 44(4), 1997, pp. 831-839

FRINGE FORMATION IN SYMMETRICAL 3-APERTURE SPECKLE SHEAR INTERFEROMETRY - AN ANALYSIS

Authors: MOHAN NK SIROHI RS

Citation: Nk. Mohan et Rs. Sirohi, FRINGE FORMATION IN SYMMETRICAL 3-APERTURE SPECKLE SHEAR INTERFEROMETRY - AN ANALYSIS, Optics and lasers in engineering, 26(4-5), 1997, pp. 437-447

PHASE CHECKER GRATING AS AN ARRAY ILLUMINATOR

Authors: BHATTACHARYA S RAO VV SIROHI RS

Citation: S. Bhattacharya et al., PHASE CHECKER GRATING AS AN ARRAY ILLUMINATOR, Optik, 106(1), 1997, pp. 15-18

AN INPLANE INSENSITIVE MULTIAPERTURE SPECKLE SHEAR INTERFEROMETER FORSLOPE MEASUREMENT

Authors: SIROHI RS MOHAN NK

Citation: Rs. Sirohi et Nk. Mohan, AN INPLANE INSENSITIVE MULTIAPERTURE SPECKLE SHEAR INTERFEROMETER FORSLOPE MEASUREMENT, Optics and Laser Technology, 29(7), 1997, pp. 415-417

DISPLACEMENT AND SLOPE MEASUREMENTS USING IMAGE PLANE HOLOGRAPHY WITHA BATIO3 CRYSTAL

Authors: SREEDHAR PR MOHAN NK SIROHI RS

Citation: Pr. Sreedhar et al., DISPLACEMENT AND SLOPE MEASUREMENTS USING IMAGE PLANE HOLOGRAPHY WITHA BATIO3 CRYSTAL, Optics and Laser Technology, 29(3), 1997, pp. 111-115

SPATIAL PHASE-SHIFTING FOR PURE INPLANE DISPLACEMENT AND DISPLACEMENT-DERIVATIVE MEASUREMENTS IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI)

Authors: SIROHI RS BURKE J HELMERS H HINSCH KD

Citation: Rs. Sirohi et al., SPATIAL PHASE-SHIFTING FOR PURE INPLANE DISPLACEMENT AND DISPLACEMENT-DERIVATIVE MEASUREMENTS IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI), Applied optics, 36(23), 1997, pp. 5787-5791

AMPLITUDE CHECKER GRATING FROM ONE-DIMENSIONAL RONCHI GRATING AND ITSAPPLICATION TO ARRAY GENERATION

Authors: BHATTACHARYA S SIROHI RS

Citation: S. Bhattacharya et Rs. Sirohi, AMPLITUDE CHECKER GRATING FROM ONE-DIMENSIONAL RONCHI GRATING AND ITSAPPLICATION TO ARRAY GENERATION, Applied optics, 36(16), 1997, pp. 3745-3752

OPTICAL CONFIGURATION FOR MEASUREMENT IN SPECKLE INTERFEROMETRY

Authors: SIROHI RS MOHAN NK SANTHANAKRISHNAN T

Citation: Rs. Sirohi et al., OPTICAL CONFIGURATION FOR MEASUREMENT IN SPECKLE INTERFEROMETRY, Optics letters, 21(24), 1996, pp. 1958-1959

SLOPE CHANGE CONTOURING FOR 3D DEEPLY CURVED OBJECTS BY MULTIAPERTURESPECKLE SHEAR INTERFEROMETRY

Authors: SANTHANAKRISHNAN T MOHAN NK SENTHILKUMARAN P SIROHI RS

Citation: T. Santhanakrishnan et al., SLOPE CHANGE CONTOURING FOR 3D DEEPLY CURVED OBJECTS BY MULTIAPERTURESPECKLE SHEAR INTERFEROMETRY, Optik, 104(1), 1996, pp. 27-31

SIMULTANEOUS IMPLEMENTATION OF LEENDERTZ AND DUFFYS METHODS FOR INPLANE DISPLACEMENT MEASUREMENT

Authors: MOHAN NK SANTHANAKRISHNAN T SENTHILKUMARAN P SIROHI RS

Citation: Nk. Mohan et al., SIMULTANEOUS IMPLEMENTATION OF LEENDERTZ AND DUFFYS METHODS FOR INPLANE DISPLACEMENT MEASUREMENT, Optics communications, 124(3-4), 1996, pp. 235-239

FABRICATION OF AN ARRAY ILLUMINATOR USING TANDEM MICHELSON INTERFEROMETERS

Authors: DARLIN JS SENTHILKUMARAN P BHATTACHARYA S KOTHIYAL MP SIROHI RS

Citation: Js. Darlin et al., FABRICATION OF AN ARRAY ILLUMINATOR USING TANDEM MICHELSON INTERFEROMETERS, Optics communications, 123(1-3), 1996, pp. 1-4

FRINGE FORMATION IN MULTIAPERTURE SPECKLE SHEAR INTERFEROMETRY

Authors: MOHAN NK SIROHI RS

Citation: Nk. Mohan et Rs. Sirohi, FRINGE FORMATION IN MULTIAPERTURE SPECKLE SHEAR INTERFEROMETRY, Applied optics, 35(10), 1996, pp. 1617-1622

HOLOGRAPHIC ARRAY ILLUMINATOR USING TANDEM MICHELSON INTERFEROMETERS - FABRICATION AND ANALYSIS

Authors: BHATTACHARYA S SENTHILKUMARAN P DARLIN JS KOTHIYAL MP SIROHI RS

Citation: S. Bhattacharya et al., HOLOGRAPHIC ARRAY ILLUMINATOR USING TANDEM MICHELSON INTERFEROMETERS - FABRICATION AND ANALYSIS, J. mod. opt., 42(11), 1995, pp. 2275-2283

Risultati: 1-25 | 26-41