Authors:
SMOLYANINOV II
ATIA WA
PILEVAR S
DAVIS CC
Citation: Ii. Smolyaninov et al., EXPERIMENTAL-STUDY OF PROBE-SURFACE INTERACTION IN NEAR-FIELD OPTICALMICROSCOPY, Ultramicroscopy, 71(1-4), 1998, pp. 177-182
Citation: Ii. Smolyaninov et Cc. Davis, APPARENT SUPERRESOLUTION IN NEAR-FIELD OPTICAL IMAGING OF PERIODIC GRATINGS, Optics letters, 23(17), 1998, pp. 1346-1347
Authors:
DAVIS CC
ATIA WA
GUNGOR A
MAZZONI DL
PILEVAR S
SMOLYANINOV II
Citation: Cc. Davis et al., SCANNING NEAR-FIELD OPTICAL MICROSCOPY AND LITHOGRAPHY WITH BARE TAPERED OPTICAL FIBERS, Laser physics, 7(1), 1997, pp. 243-256
Authors:
SMOLYANINOV II
MAZZONI DL
MAIT J
DAVIS CC
Citation: Ii. Smolyaninov et al., EXPERIMENTAL-STUDY OF SURFACE-PLASMON SCATTERING BY INDIVIDUAL SURFACE-DEFECTS, Physical review. B, Condensed matter, 56(3), 1997, pp. 1601-1611
Citation: Ii. Smolyaninov et al., NEAR-FIELD 2ND-HARMONIC GENERATION FROM A ROUGH METAL-SURFACE, Physical review. B, Condensed matter, 56(15), 1997, pp. 9290-9293
Citation: Ii. Smolyaninov et al., NEAR-FIELD 2ND-HARMONIC IMAGING OF FERROMAGNETIC AND FERROELECTRIC MATERIALS, Optics letters, 22(21), 1997, pp. 1592-1594
Citation: Ii. Smolyaninov, PHOTON-EMISSION FROM A LAYER OF COPPER PHTHALOCYANINE MOLECULES ON A GOLD (111) FILM SURFACE-INDUCED BY STM, Surface science, 364(1), 1996, pp. 79-88
Citation: Ii. Smolyaninov et al., IMAGING OF SURFACE-PLASMON SCATTERING BY LITHOGRAPHICALLY CREATED INDIVIDUAL SURFACE-DEFECTS, Physical review letters, 77(18), 1996, pp. 3877-3880
Citation: Si. Bozhevolnyi et Ii. Smolyaninov, CHARACTERIZATION OF PHASE-CONJUGATED NEAR-FIELD LIGHT SPOTS, Journal of the Optical Society of America. B, Optical physics, 12(9), 1995, pp. 1617-1620
Authors:
BOZHEVOLNYI SI
VOHNSEN B
SMOLYANINOV II
ZAYATS AV
Citation: Si. Bozhevolnyi et al., DIRECT OBSERVATION OF SURFACE POLARITON LOCALIZATION CAUSED BY SURFACE-ROUGHNESS, Optics communications, 117(5-6), 1995, pp. 417-423
Citation: Ii. Smolyaninov et al., NEAR-FIELD DIRECT-WRITE ULTRAVIOLET LITHOGRAPHY AND SHEAR FORCE MICROSCOPIC STUDIES OF THE LITHOGRAPHIC PROCESS, Applied physics letters, 67(26), 1995, pp. 3859-3861
Citation: Si. Bozhevolnyi et al., CORRELATION BETWEEN OPTICAL AND TOPOGRAPHICAL IMAGES FROM AN EXTERNALREFLECTION NEAR-FIELD MICROSCOPE WITH SHEAR FORCE FEEDBACK, Applied optics, 34(19), 1995, pp. 3793-3799
Citation: Ii. Smolyaninov et O. Keller, CHERENKOV EFFECT IN THE CONTEXT OF SCANNING-TUNNELING-MICROSCOPY, Physica status solidi. b, Basic research, 185(1), 1994, pp. 275-288
Authors:
GOLONZKA OV
SMOLYANINOV II
VINOGRADOV EA
ZAYATS AV
PUDONIN FA
Citation: Ov. Golonzka et al., INVESTIGATION OF CARRIER TUNNELING IN SHORT-PERIOD A-SI SIO2 QUANTUM STRUCTURES WITH A SCANNING TUNNELING MICROSCOPE/, Physica status solidi. b, Basic research, 181(1), 1994, pp. 109-115
Citation: Ii. Smolyaninov et Ev. Moskovets, EMISSION OF PHOTONS FROM TUNNEL CONTACT I N A SCANNING TUNNEL MICROSCOPE, Optika i spektroskopia, 76(2), 1994, pp. 353-358
Authors:
SMOLYANINOV II
CORATGER R
AJUSTRON F
BEAUVILLAIN J
Citation: Ii. Smolyaninov et al., OBSERVATION OF PLEATED STRUCTURES IN A LAYER OF COPPER PHTHALOCYANINEMOLECULES ON GOLD(111) FILM SURFACES, Physics letters. A, 181(3), 1993, pp. 251-258
Citation: Ii. Smolyaninov, ON THE DIFFERENCE BETWEEN LIGHT-EMISSION VERSUS VOLTAGE CHARACTERISTICS IN AIR AND IN ULTRAHIGH-VACUUM, Physics letters. A, 181(2), 1993, pp. 175-178