Authors:
ZHELUDEVA SI
KOVALCHUK MV
NOVIKOVA NN
SOSPHENOV AN
SALASCHENKO NN
SHAMOV EA
PROKHOROV KA
BURATTINI E
CAPPUCCIO G
Citation: Si. Zheludeva et al., X-RAY STANDING WAVES IN X-RAY SPECULAR REFLECTION AND FLUORESCENCE STUDY OF NANO-FILMS, Journal of applied crystallography, 30(2), 1997, pp. 833-838
Authors:
ZHELUDEVA SI
KOVALCHUK MV
NOVIKOVA NN
SOSPHENOV AN
MALYSHEVA NE
SALASHENKO NN
AKHSAKHALYAN AD
PLATONOV YY
CERNIK RI
COLLINS SP
Citation: Si. Zheludeva et al., NEW METHOD OF ULTRA-THIN FILM CHARACTERIZATION APPLIED TO THE INVESTIGATION OF C NI/C STRUCTURES UNDER HEAT LOAD/, Thin solid films, 259(2), 1995, pp. 131-138
Authors:
ZHELUDEVA SI
KOVALCHUK MV
NOVIKOVA NN
SOSPHENOV AN
MALYSHEVA NE
SALASHENKO NN
AKHSAKHALYAN AD
PLATONOV YY
Citation: Si. Zheludeva et al., INVESTIGATION OF HEAT-TREATMENT EFFECTS ON NI C BILAYER PARAMETERS BYXRSW/, Physica. B, Condensed matter, 198(1-3), 1994, pp. 259-261
Authors:
ZHELUDEVA SI
KOVALCHUK MV
NOVIKOVA NN
SOSPHENOV AN
MALYSHEVA NE
SALASHCHENKO NN
AKHSAKHALYAN AD
PLATONOV YY
Citation: Si. Zheludeva et al., NEW MODIFICATION OF X-RAY STANDING WAVES ABOVE THE SURFACE OF LAYEREDSUBSTRATES UNDER TOTAL EXTERNAL REFLECTION CONDITIONS FOR STRUCTURAL CHARACTERIZATION OF ORGANIC LAYERS, Thin solid films, 232(2), 1993, pp. 252-255
Authors:
ZHELUDEVA SI
KOVALCHUK MV
NOVIKOVA NN
SOSPHENOV AN
EROCHIN VE
FEIGIN LA
Citation: Si. Zheludeva et al., X-RAY TOTAL EXTERNAL REFLECTION FLUORESCENCE STUDY OF LB FILMS ON SOLID SUBSTRATE, Journal of physics. D, Applied physics, 26(4A), 1993, pp. 202-205
Authors:
ZHELUDEVA SI
KOVALCHUK MV
NOVIKOVA NN
SOSPHENOV AN
Citation: Si. Zheludeva et al., X-RAY STANDING WAVES IN LSM FOR CHARACTERIZATION OF ULTRA-THIN FILMS, Journal of physics. D, Applied physics, 26(4A), 1993, pp. 206-209