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Results: 1-11 |
Results: 11

Authors: del Cotero, JNF Moreno, F Ortiz, D Velez, E Gonzalez, F Saiz, JM Velarde, JI De Valentin-Gamazo, L Garcia-Anton, P
Citation: Jnf. Del Cotero et al., Geometric ray tracing analysis of visual acuity after laser in site keratomileusis, J REFRACT S, 17(3), 2001, pp. 305-309

Authors: Gonzalez, F Ortiz, D Saiz, JM Moreno, F del Cotero, JNF
Citation: F. Gonzalez et al., Unexpected corneal flattening after laser in situ keratomileusis, J REFRACT S, 17(2), 2001, pp. S180-S186

Authors: Saiz, JM de la Pena, JL Gonzalez, F Moreno, F
Citation: Jm. Saiz et al., Detection and recognition of local defects in 1D structures, OPT COMMUN, 196(1-6), 2001, pp. 33-39

Authors: Gonzalez, F Videen, G Valle, PJ Saiz, JM de la Pena, JL Moreno, F
Citation: F. Gonzalez et al., Light scattering computational methods for particles on substrates, J QUAN SPEC, 70(4-6), 2001, pp. 383-393

Authors: de la Pena, JL Saiz, JM Gonzalez, F
Citation: Jl. De La Pena et al., Profile of a fiber from backscattering measurements, OPTICS LETT, 25(23), 2000, pp. 1699-1701

Authors: de la Pena, JL Saiz, JM Valle, PJ Gonzalez, F Moreno, FF
Citation: Jl. De La Pena et al., Tracking scattering minima to size metallic particles on flat substrates, PART PART S, 16(3), 1999, pp. 113-118

Authors: de la Pena, JL Saiz, JM Videen, G Gonzalez, F Valle, PJ Moreno, F
Citation: Jl. De La Pena et al., Scattering from particles on surfaces: visibility factor and polydispersity, OPTICS LETT, 24(21), 1999, pp. 1451-1453

Authors: de la Pena, JL Gonzalez, F Saiz, JM Moreno, F Valle, PJ
Citation: Jl. De La Pena et al., Application of a double-interaction model to the backscattering from particulate surfaces, OPT ENG, 38(6), 1999, pp. 1017-1023

Authors: de la Pena, JL Saiz, JM Valle, PJ Gonzalez, F Moreno, F Videen, G
Citation: Jl. De La Pena et al., Enhanced backscatter from monodisperse contaminants on a substrate, J QUAN SPEC, 63(2-6), 1999, pp. 383-392

Authors: de la Pena, JL Gonzalez, F Saiz, JM Moreno, F Valle, PJ
Citation: Jl. De La Pena et al., Sizing particles on substrates: A general method for oblique incidence, J APPL PHYS, 85(1), 1999, pp. 432-438

Authors: Moreno, F Gonzalez, F Saiz, JM Madrazo, A
Citation: F. Moreno et al., Time interval statistics through a Laplace Transform method. Applications to size distribution determination in light scattering experiments, TR APPL SPE, 2, 1998, pp. 105-117
Risultati: 1-11 |