Authors:
Takeuchi, K
Satoh, S
Tanaka, T
Imamiya, K
Sakui, K
Citation: K. Takeuchi et al., A negative V-th cell architecture for highly scalable, excellently noise-immune, and highly reliable NAND flash memories, IEEE J SOLI, 34(5), 1999, pp. 675-684
Authors:
Imamiya, K
Sugiura, Y
Nakamura, H
Himeno, T
Takeuchi, K
Ikehashi, T
Kanda, K
Hosono, K
Shirota, R
Aritome, S
Shimizu, K
Hatakeyama, K
Sakui, K
Citation: K. Imamiya et al., A 130-mm(2), 256-mbit NAND flash with shallow trench isolation technology, IEEE J SOLI, 34(11), 1999, pp. 1536-1543