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Results: 1-12 |
Results: 12
Optical absorption rate determination, on the front facet of high-power GaAs laser diodes, by means of thermoreflectance technique
Authors: Schaub, E
Citation: E. Schaub, Optical absorption rate determination, on the front facet of high-power GaAs laser diodes, by means of thermoreflectance technique, JPN J A P 1, 40(4B), 2001, pp. 2752-2756
New calibration procedure for absolute temperature measurement on electronic devices, by means of thermoreflectance technique
Authors: Schaub, E
Citation: E. Schaub, New calibration procedure for absolute temperature measurement on electronic devices, by means of thermoreflectance technique, ANAL SCI, 17, 2001, pp. S443-S446
New calibration procedure for absolute temperature measurement on electronic devices, by means of thermoreflectance technique
Authors: Schaub, E
Citation: E. Schaub, New calibration procedure for absolute temperature measurement on electronic devices, by means of thermoreflectance technique, ANAL SCI, 17, 2001, pp. S503-S506
Laser diode COFD analysis by thermoreflectance microscopy
Authors: Dilhaire, S Grauby, S Jorez, S Lopez, LDP Schaub, E Claeys, W
Citation: S. Dilhaire et al., Laser diode COFD analysis by thermoreflectance microscopy, MICROEL REL, 41(9-10), 2001, pp. 1597-1601
Laser diode light efficiency determination by thermoreflectance microscopy
Authors: Dilhaire, S Jorez, S Patino-Lopez, LD Claeys, W Schaub, E
Citation: S. Dilhaire et al., Laser diode light efficiency determination by thermoreflectance microscopy, MICROELEC J, 32(10-11), 2001, pp. 899-901
Thermal coupling in integrated circuits: Application to thermal testing
Authors: Altet, J Rubio, A Schaub, E Dilhaire, S Claeys, W
Citation: J. Altet et al., Thermal coupling in integrated circuits: Application to thermal testing, IEEE J SOLI, 36(1), 2001, pp. 81-91
Localisation of heat sources in electronic circuits by microthermal laser probing
Authors: Dilhaire, S Schaub, E Claeys, W Altet, J Rubio, A
Citation: S. Dilhaire et al., Localisation of heat sources in electronic circuits by microthermal laser probing, INT J TH SC, 39(4), 2000, pp. 544-549
Differential thermal testing: An approach to its feasibility
Authors: Altet, J Rubio, A Claeys, W Dilhaire, S Schaub, E Tamamoto, H
Citation: J. Altet et al., Differential thermal testing: An approach to its feasibility, J ELEC TEST, 14(1-2), 1999, pp. 57-66
Fault localisation in ICs by goniometric laser probing of thermal induced surface waves
Authors: Dilhaire, S Altet, J Jorez, S Schaub, E Rubio, A Claeys, W
Citation: S. Dilhaire et al., Fault localisation in ICs by goniometric laser probing of thermal induced surface waves, MICROEL REL, 39(6-7), 1999, pp. 919-923
Optical method for the measurement of the thermomechanical behaviour of electronic devices
Authors: Dilhaire, S Jorez, S Cornet, A Schaub, E Claeys, W
Citation: S. Dilhaire et al., Optical method for the measurement of the thermomechanical behaviour of electronic devices, MICROEL REL, 39(6-7), 1999, pp. 981-985
High-resolution interferometry and electronic speckle pattern interferometry applied to the thermomechanical study of a MOS power transistor
Authors: Nassim, K Joannes, L Cornet, A Dilhaire, S Schaub, E Claeys, W
Citation: K. Nassim et al., High-resolution interferometry and electronic speckle pattern interferometry applied to the thermomechanical study of a MOS power transistor, MICROELEC J, 30(11), 1999, pp. 1125-1128
Development of instruments and very-high-resolution laser methodologies for characterization of electronic components
Authors: Claeys, W Dilhaire, S Phan, T Schaub, E
Citation: W. Claeys et al., Development of instruments and very-high-resolution laser methodologies for characterization of electronic components, ANN PHYSIQ, 23, 1998, pp. 65-72
Risultati: 1-12 |