Authors: Egelhoff, WF Chen, PJ McMichael, RD Powell, CJ Deslattes, RD Serpa, FG Gomez, RD

Citation: Wf. Egelhoff et al., Surface oxidation as a diffusion barrier for Al deposited on ferromagneticmetals, J APPL PHYS, 89(9), 2001, pp. 5209-5214

Authors: Lu, RP Morgan, BA Kavanagh, KL Powell, CJ Chen, PJ Serpa, FG Egelhoff, WF

Citation: Rp. Lu et al., Interfacial scattering of hot electrons in ultrathin Au/Co films, J VAC SCI B, 18(4), 2000, pp. 2047-2051

Authors: Chantler, CT Paterson, D Hudson, LT Serpa, FG Gillaspy, JD Takacs, E

Citation: Ct. Chantler et al., Absolute measurement of the resonance lines in heliumlike vanadium on an electron-beam ion trap - art. no. 042501, PHYS REV A, 6204(4), 2000, pp. 2501

Authors: McMichael, RD Lee, CG Stiles, MD Serpa, FG Chen, PJ Egelhoff, WF

Citation: Rd. Mcmichael et al., Exchange bias relaxation in CoO-biased films, J APPL PHYS, 87(9), 2000, pp. 6406-6408

Authors: Lu, RP Morgan, BA Kavanagh, KL Powell, CJ Chen, PJ Serpa, FG Egelhoff, WF

Citation: Rp. Lu et al., Hot-electron attenuation lengths in ultrathin magnetic films, J APPL PHYS, 87(9), 2000, pp. 5164-5166

Authors: Chantler, CT Paterson, D Hudson, LT Serpa, FG Gillaspy, JD Takacs, E

Citation: Ct. Chantler et al., Precision X-ray spectroscopy at the NIST electron-beam ion trap: Resolution of major systematic error, PHYS SCR, T80B, 1999, pp. 440-442